000808643 001__ 808643
000808643 005__ 20210129222811.0
000808643 0247_ $$2doi$$a10.1209/0295-5075/111/64002
000808643 0247_ $$2ISSN$$a0295-5075
000808643 0247_ $$2ISSN$$a0302-072X
000808643 0247_ $$2ISSN$$a1286-4854
000808643 0247_ $$2WOS$$aWOS:000364539400018
000808643 037__ $$aFZJ-2016-02285
000808643 082__ $$a530
000808643 1001_ $$0P:(DE-HGF)0$$aLoetgering, L.$$b0$$eCorresponding author
000808643 245__ $$aA phase retrieval algorithm based on three-dimensionally translated diffraction patterns
000808643 260__ $$aLes-Ulis$$bEDP Science65224$$c2015
000808643 264_1 $$2Crossref$$3online$$bIOP Publishing$$c2015-09-29
000808643 264_1 $$2Crossref$$3print$$bIOP Publishing$$c2015-09-01
000808643 264_1 $$2Crossref$$3print$$bIOP Publishing$$c2015-09-01
000808643 3367_ $$2DRIVER$$aarticle
000808643 3367_ $$2DataCite$$aOutput Types/Journal article
000808643 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1467705596_2698
000808643 3367_ $$2BibTeX$$aARTICLE
000808643 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000808643 3367_ $$00$$2EndNote$$aJournal Article
000808643 520__ $$aAn iterative phase retrieval method is proposed that combines alternating projections and registration of three-dimensionally translated near-field diffraction patterns. This method allows to enhance resolution limited by a finite detector size and automatically stitches the assembled data while avoiding the need for a priori knowledge or scanning of the object as encountered in coherent diffraction imaging or ptychography.
000808643 536__ $$0G:(DE-HGF)POF3-899$$a899 - ohne Topic (POF3-899)$$cPOF3-899$$fPOF III$$x0
000808643 542__ $$2Crossref$$i2015-09-29$$uhttp://iopscience.iop.org/info/page/text-and-data-mining
000808643 542__ $$2Crossref$$i2015-09-29$$uhttp://iopscience.iop.org/page/copyright
000808643 588__ $$aDataset connected to CrossRef
000808643 7001_ $$0P:(DE-HGF)0$$aHammoud, R.$$b1
000808643 7001_ $$0P:(DE-Juel1)157957$$aJuschkin, L.$$b2$$ufzj
000808643 7001_ $$0P:(DE-HGF)0$$aWilhein, T.$$b3
000808643 77318 $$2Crossref$$3journal-article$$a10.1209/0295-5075/111/64002$$b : IOP Publishing, 2015-09-01$$n6$$p64002$$tEPL (Europhysics Letters)$$v111$$x0295-5075$$y2015
000808643 773__ $$0PERI:(DE-600)1465366-7$$a10.1209/0295-5075/111/64002$$gVol. 111, no. 6, p. 64002 -$$n6$$p64002$$tepl$$v111$$x0295-5075$$y2015
000808643 8564_ $$uhttps://juser.fz-juelich.de/record/808643/files/epl_111_6_64002.pdf$$yRestricted
000808643 8564_ $$uhttps://juser.fz-juelich.de/record/808643/files/epl_111_6_64002.pdf?subformat=pdfa$$xpdfa$$yRestricted
000808643 909CO $$ooai:juser.fz-juelich.de:808643$$pVDB
000808643 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)157957$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000808643 9131_ $$0G:(DE-HGF)POF3-899$$1G:(DE-HGF)POF3-890$$2G:(DE-HGF)POF3-800$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bProgrammungebundene Forschung$$lohne Programm$$vohne Topic$$x0
000808643 9141_ $$y2016
000808643 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bEPL-EUROPHYS LETT : 2014
000808643 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000808643 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000808643 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000808643 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000808643 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000808643 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000808643 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000808643 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000808643 920__ $$lno
000808643 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0
000808643 980__ $$ajournal
000808643 980__ $$aVDB
000808643 980__ $$aI:(DE-Juel1)PGI-9-20110106
000808643 980__ $$aUNRESTRICTED