Poster (Other)

FZJ-2016-02497

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Ion Migration in Amorphous HfOx

Schie, M. ; Salinga, M. ; Waser, R.FZJ* ; De Souza, R. A.

2016

---

Contributing Institute(s):

1. Elektronische Materialien (PGI-7)

Research Program(s):

1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2016

---

Database coverage:
No Authors Fulltext

---