000809770 001__ 809770
000809770 005__ 20210129223113.0
000809770 0247_ $$2doi$$a10.1111/jace.14092
000809770 0247_ $$2ISSN$$a0002-7820
000809770 0247_ $$2ISSN$$a1551-2916
000809770 0247_ $$2Handle$$a2128/11253
000809770 0247_ $$2WOS$$aWOS:000373931900032
000809770 037__ $$aFZJ-2016-02697
000809770 082__ $$a660
000809770 1001_ $$00000-0002-0058-0522$$aKao, Yu-Ju$$b0
000809770 245__ $$aHydroxyl Defect Effect on Reoxidation of Sc-Doped (Ba,Ca)(Ti,Zr)O 3 Fired in Reducing Atmospheres
000809770 260__ $$aOxford [u.a.]$$bWiley-Blackwell$$c2016
000809770 3367_ $$2DRIVER$$aarticle
000809770 3367_ $$2DataCite$$aOutput Types/Journal article
000809770 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1464618451_31311
000809770 3367_ $$2BibTeX$$aARTICLE
000809770 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000809770 3367_ $$00$$2EndNote$$aJournal Article
000809770 520__ $$aThe behavior of grain and grain-boundary conductivity of acceptor (Sc)-doped (Ba,Ca)(Ti,Zr)O3 ceramics sintered in moist reducing atmosphere and subsequently reoxidized in dry and moist atmosphere was investigated by means of impedance spectroscopy (IS). In moist firing atmosphere, water vapor was found to react with oxygen vacancies, forming positively charged hydroxyl defects inline image on regular oxygen sites in the crystal lattice. Proton hopping is considered to raise the ionic conductivity significantly. Therefore, hydroxyl defects inline image in turn influence the grain conduction. Hydroxyl defects inline image are also considered to be responsible for alternations of the dielectric maximum at the Curie point.
000809770 536__ $$0G:(DE-HGF)POF3-524$$a524 - Controlling Collective States (POF3-524)$$cPOF3-524$$fPOF III$$x0
000809770 588__ $$aDataset connected to CrossRef
000809770 7001_ $$0P:(DE-HGF)0$$aSu, Che-Yi$$b1
000809770 7001_ $$0P:(DE-Juel1)130894$$aPithan, Christian$$b2$$ufzj
000809770 7001_ $$0P:(DE-Juel1)130705$$aHennings, Detlev$$b3$$ufzj
000809770 7001_ $$0P:(DE-HGF)0$$aHuang, Chi-Yuen$$b4$$eCorresponding author
000809770 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b5$$ufzj
000809770 773__ $$0PERI:(DE-600)2008170-4$$a10.1111/jace.14092$$gVol. 99, no. 4, p. 1311 - 1317$$n4$$p1311 - 1317$$tJournal of the American Ceramic Society$$v99$$x0002-7820$$y2016
000809770 8564_ $$uhttps://juser.fz-juelich.de/record/809770/files/Kao_et_al-2016-Journal_of_the_American_Ceramic_Society.pdf$$yOpenAccess
000809770 8564_ $$uhttps://juser.fz-juelich.de/record/809770/files/Kao_et_al-2016-Journal_of_the_American_Ceramic_Society.gif?subformat=icon$$xicon$$yOpenAccess
000809770 8564_ $$uhttps://juser.fz-juelich.de/record/809770/files/Kao_et_al-2016-Journal_of_the_American_Ceramic_Society.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000809770 8564_ $$uhttps://juser.fz-juelich.de/record/809770/files/Kao_et_al-2016-Journal_of_the_American_Ceramic_Society.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000809770 8564_ $$uhttps://juser.fz-juelich.de/record/809770/files/Kao_et_al-2016-Journal_of_the_American_Ceramic_Society.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000809770 8564_ $$uhttps://juser.fz-juelich.de/record/809770/files/Kao_et_al-2016-Journal_of_the_American_Ceramic_Society.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000809770 909CO $$ooai:juser.fz-juelich.de:809770$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000809770 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-HGF)0$$aForschungszentrum Jülich$$b5$$kFZJ
000809770 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130705$$aForschungszentrum Jülich$$b3$$kFZJ
000809770 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich$$b5$$kFZJ
000809770 9131_ $$0G:(DE-HGF)POF3-524$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Collective States$$x0
000809770 9141_ $$y2016
000809770 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000809770 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology
000809770 915__ $$0LIC:(DE-HGF)CCBYNCND4$$2HGFVOC$$aCreative Commons Attribution-NonCommercial-NoDerivs CC BY-NC-ND 4.0
000809770 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bJ AM CERAM SOC : 2014
000809770 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000809770 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000809770 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000809770 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000809770 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000809770 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000809770 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000809770 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000809770 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000809770 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000809770 980__ $$ajournal
000809770 980__ $$aVDB
000809770 980__ $$aUNRESTRICTED
000809770 980__ $$aI:(DE-Juel1)PGI-7-20110106
000809770 9801_ $$aFullTexts