001     809865
005     20210129223155.0
024 7 _ |a 10.1364/OL.39.006969
|2 doi
024 7 _ |a 0146-9592
|2 ISSN
024 7 _ |a 1539-4794
|2 ISSN
024 7 _ |a WOS:000346347900052
|2 WOS
024 7 _ |a altmetric:2980912
|2 altmetric
024 7 _ |a pmid:25503043
|2 pmid
037 _ _ |a FZJ-2016-02791
082 _ _ |a 530
100 1 _ |a Kim, Hyun-su
|0 P:(DE-HGF)0
|b 0
|e Corresponding author
245 _ _ |a Fractional Talbot lithography with extreme ultraviolet light
260 _ _ |a Washington, DC
|c 2014
|b Soc.
336 7 _ |a article
|2 DRIVER
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|b journal
|m journal
|0 PUB:(DE-HGF)16
|s 1467706595_2695
|2 PUB:(DE-HGF)
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a Journal Article
|0 0
|2 EndNote
520 _ _ |a Fractional Talbot effect leads to the possibility to implement patterning of structures with smaller periods than the master mask. This is particularly attractive when using short wavelength illumination in the extreme ultraviolet because of attainable resolution in the sub-100-nm range. In this Letter, we demonstrate the Talbot lithography with the fractional Talbot effect under coherent illumination generated with a capillary discharge Ne-like Ar extreme ultraviolet laser. Various spatial frequency multiplications up to 5𝑥 are achieved using a parent grating. This technique allows a fabrication of nanostructures with high-resolution patterns, which is of high interest in many applications such as the manufacturing of plasmonic surfaces and photonic devices.
536 _ _ |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521)
|0 G:(DE-HGF)POF3-521
|c POF3-521
|f POF III
|x 0
588 _ _ |a Dataset connected to CrossRef
700 1 _ |a Li, Wei
|0 P:(DE-HGF)0
|b 1
700 1 _ |a Danylyuk, Serhiy
|0 P:(DE-HGF)0
|b 2
700 1 _ |a Brocklesby, William S.
|0 P:(DE-HGF)0
|b 3
700 1 _ |a Marconi, Mario C.
|0 P:(DE-HGF)0
|b 4
700 1 _ |a Juschkin, Larissa
|0 P:(DE-Juel1)157957
|b 5
|e Corresponding author
773 _ _ |a 10.1364/OL.39.006969
|g Vol. 39, no. 24, p. 6969 -
|0 PERI:(DE-600)1479014-2
|n 24
|p 6969-6972
|t Optics letters
|v 39
|y 2014
|x 1539-4794
856 4 _ |u https://juser.fz-juelich.de/record/809865/files/ol-39-24-6969.pdf
|y Restricted
856 4 _ |u https://juser.fz-juelich.de/record/809865/files/ol-39-24-6969.gif?subformat=icon
|x icon
|y Restricted
856 4 _ |u https://juser.fz-juelich.de/record/809865/files/ol-39-24-6969.jpg?subformat=icon-1440
|x icon-1440
|y Restricted
856 4 _ |u https://juser.fz-juelich.de/record/809865/files/ol-39-24-6969.jpg?subformat=icon-180
|x icon-180
|y Restricted
856 4 _ |u https://juser.fz-juelich.de/record/809865/files/ol-39-24-6969.jpg?subformat=icon-640
|x icon-640
|y Restricted
856 4 _ |u https://juser.fz-juelich.de/record/809865/files/ol-39-24-6969.pdf?subformat=pdfa
|x pdfa
|y Restricted
909 C O |o oai:juser.fz-juelich.de:809865
|p VDB
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)166021
910 1 _ |a RWTH Aachen
|0 I:(DE-588b)36225-6
|k RWTH
|b 2
|6 P:(DE-HGF)0
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 5
|6 P:(DE-Juel1)157957
910 1 _ |a RWTH Aachen
|0 I:(DE-588b)36225-6
|k RWTH
|b 5
|6 P:(DE-Juel1)157957
913 1 _ |a DE-HGF
|b Key Technologies
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-520
|0 G:(DE-HGF)POF3-521
|2 G:(DE-HGF)POF3-500
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
914 1 _ |y 2016
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0200
|2 StatID
|b SCOPUS
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0300
|2 StatID
|b Medline
915 _ _ |a JCR
|0 StatID:(DE-HGF)0100
|2 StatID
|b OPT LETT : 2014
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0199
|2 StatID
|b Thomson Reuters Master Journal List
915 _ _ |a WoS
|0 StatID:(DE-HGF)0110
|2 StatID
|b Science Citation Index
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0150
|2 StatID
|b Web of Science Core Collection
915 _ _ |a WoS
|0 StatID:(DE-HGF)0111
|2 StatID
|b Science Citation Index Expanded
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)1150
|2 StatID
|b Current Contents - Physical, Chemical and Earth Sciences
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)1160
|2 StatID
|b Current Contents - Engineering, Computing and Technology
915 _ _ |a IF < 5
|0 StatID:(DE-HGF)9900
|2 StatID
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-9-20110106
|k PGI-9
|l Halbleiter-Nanoelektronik
|x 0
920 1 _ |0 I:(DE-82)080009_20140620
|k JARA-FIT
|l JARA-FIT
|x 1
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a I:(DE-Juel1)PGI-9-20110106
980 _ _ |a I:(DE-82)080009_20140620
980 _ _ |a UNRESTRICTED


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21