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000811645 1001_ $$0P:(DE-HGF)0$$aGreen, Matthew F. B.$$b0
000811645 245__ $$aScanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces
000811645 260__ $$aBristol$$bIOP Publ.$$c2016
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000811645 520__ $$aIn this paper we review a recently introduced microscopy technique, scanning quantum dot microscopy (SQDM), which delivers quantitative maps of local electrostatic potential near surfaces in three dimensions. The key to achieving SQDM imaging is the functionalization of a scanning probe microscope tip with a π-conjugated molecule that acts as a gateable QD. Mapping of electrostatic potential with SQDM is performed by gating the QD by the bias voltage applied to the scanning probe microscope junction and registering changes of the QD charge state with frequency-modulated atomic force microscopy.
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000811645 7001_ $$0P:(DE-Juel1)140276$$aWagner, Christian$$b1$$ufzj
000811645 7001_ $$0P:(DE-Juel1)164154$$aLeinen, Philipp$$b2$$ufzj
000811645 7001_ $$0P:(DE-HGF)0$$aDeilmann, Thorsten$$b3
000811645 7001_ $$0P:(DE-HGF)0$$aKrüger, Peter$$b4
000811645 7001_ $$0P:(DE-HGF)0$$aRohlfing, Michael$$b5
000811645 7001_ $$0P:(DE-Juel1)128791$$aTautz, Frank Stefan$$b6$$ufzj
000811645 7001_ $$0P:(DE-Juel1)128792$$aTemirov, Ruslan$$b7$$ufzj
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