TY  - JOUR
AU  - Green, Matthew F. B.
AU  - Wagner, Christian
AU  - Leinen, Philipp
AU  - Deilmann, Thorsten
AU  - Krüger, Peter
AU  - Rohlfing, Michael
AU  - Tautz, Frank Stefan
AU  - Temirov, Ruslan
TI  - Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces
JO  - Japanese journal of applied physics
VL  - 55
IS  - 8S1
SN  - 1347-4065
CY  - Bristol
PB  - IOP Publ.
M1  - FZJ-2016-04036
SP  - 08NA04 -7
PY  - 2016
AB  - In this paper we review a recently introduced microscopy technique, scanning quantum dot microscopy (SQDM), which delivers quantitative maps of local electrostatic potential near surfaces in three dimensions. The key to achieving SQDM imaging is the functionalization of a scanning probe microscope tip with a π-conjugated molecule that acts as a gateable QD. Mapping of electrostatic potential with SQDM is performed by gating the QD by the bias voltage applied to the scanning probe microscope junction and registering changes of the QD charge state with frequency-modulated atomic force microscopy.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000403916600001
DO  - DOI:10.7567/JJAP.55.08NA04
UR  - https://juser.fz-juelich.de/record/811645
ER  -