001     811645
005     20210129223908.0
024 7 _ |2 doi
|a 10.7567/JJAP.55.08NA04
024 7 _ |2 ISSN
|a 0021-4922
024 7 _ |2 ISSN
|a 1347-4065
024 7 _ |a WOS:000403916600001
|2 WOS
037 _ _ |a FZJ-2016-04036
041 _ _ |a English
082 _ _ |a 530
100 1 _ |0 P:(DE-HGF)0
|a Green, Matthew F. B.
|b 0
245 _ _ |a Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces
260 _ _ |a Bristol
|b IOP Publ.
|c 2016
336 7 _ |2 DRIVER
|a article
336 7 _ |2 DataCite
|a Output Types/Journal article
336 7 _ |0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
|a Journal Article
|b journal
|m journal
|s 1469625846_20812
336 7 _ |2 BibTeX
|a ARTICLE
336 7 _ |2 ORCID
|a JOURNAL_ARTICLE
336 7 _ |0 0
|2 EndNote
|a Journal Article
520 _ _ |a In this paper we review a recently introduced microscopy technique, scanning quantum dot microscopy (SQDM), which delivers quantitative maps of local electrostatic potential near surfaces in three dimensions. The key to achieving SQDM imaging is the functionalization of a scanning probe microscope tip with a π-conjugated molecule that acts as a gateable QD. Mapping of electrostatic potential with SQDM is performed by gating the QD by the bias voltage applied to the scanning probe microscope junction and registering changes of the QD charge state with frequency-modulated atomic force microscopy.
536 _ _ |0 G:(DE-HGF)POF3-141
|a 141 - Controlling Electron Charge-Based Phenomena (POF3-141)
|c POF3-141
|f POF III
|x 0
588 _ _ |a Dataset connected to CrossRef
700 1 _ |0 P:(DE-Juel1)140276
|a Wagner, Christian
|b 1
|u fzj
700 1 _ |0 P:(DE-Juel1)164154
|a Leinen, Philipp
|b 2
|u fzj
700 1 _ |0 P:(DE-HGF)0
|a Deilmann, Thorsten
|b 3
700 1 _ |0 P:(DE-HGF)0
|a Krüger, Peter
|b 4
700 1 _ |0 P:(DE-HGF)0
|a Rohlfing, Michael
|b 5
700 1 _ |0 P:(DE-Juel1)128791
|a Tautz, Frank Stefan
|b 6
|u fzj
700 1 _ |0 P:(DE-Juel1)128792
|a Temirov, Ruslan
|b 7
|u fzj
773 _ _ |0 PERI:(DE-600)2006801-3
|a 10.7567/JJAP.55.08NA04
|g Vol. 55, no. 8S1, p. 08NA04 -
|n 8S1
|p 08NA04 -7
|t Japanese journal of applied physics
|v 55
|x 1347-4065
|y 2016
856 4 _ |u https://juser.fz-juelich.de/record/811645/files/jjap_55_8S1_08NA04.pdf
|y Restricted
856 4 _ |u https://juser.fz-juelich.de/record/811645/files/jjap_55_8S1_08NA04.pdf?subformat=pdfa
|x pdfa
|y Restricted
909 C O |o oai:juser.fz-juelich.de:811645
|p VDB
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)140276
|a Forschungszentrum Jülich
|b 1
|k FZJ
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)164154
|a Forschungszentrum Jülich
|b 2
|k FZJ
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)128791
|a Forschungszentrum Jülich
|b 6
|k FZJ
910 1 _ |0 I:(DE-588b)5008462-8
|6 P:(DE-Juel1)128792
|a Forschungszentrum Jülich
|b 7
|k FZJ
913 1 _ |0 G:(DE-HGF)POF3-141
|1 G:(DE-HGF)POF3-140
|2 G:(DE-HGF)POF3-100
|a DE-HGF
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
|b Energie
914 1 _ |y 2016
915 _ _ |0 StatID:(DE-HGF)0200
|2 StatID
|a DBCoverage
|b SCOPUS
915 _ _ |0 StatID:(DE-HGF)0100
|2 StatID
|a JCR
|b JPN J APPL PHYS : 2014
915 _ _ |0 StatID:(DE-HGF)0150
|2 StatID
|a DBCoverage
|b Web of Science Core Collection
915 _ _ |0 StatID:(DE-HGF)0110
|2 StatID
|a WoS
|b Science Citation Index
915 _ _ |0 StatID:(DE-HGF)0111
|2 StatID
|a WoS
|b Science Citation Index Expanded
915 _ _ |0 StatID:(DE-HGF)9900
|2 StatID
|a IF < 5
915 _ _ |0 StatID:(DE-HGF)1150
|2 StatID
|a DBCoverage
|b Current Contents - Physical, Chemical and Earth Sciences
915 _ _ |0 StatID:(DE-HGF)0300
|2 StatID
|a DBCoverage
|b Medline
915 _ _ |0 StatID:(DE-HGF)0550
|2 StatID
|a No Authors Fulltext
915 _ _ |0 StatID:(DE-HGF)0199
|2 StatID
|a DBCoverage
|b Thomson Reuters Master Journal List
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-3-20110106
|k PGI-3
|l Funktionale Nanostrukturen an Oberflächen
|x 0
920 1 _ |0 I:(DE-82)080009_20140620
|k JARA-FIT
|l JARA-FIT
|x 1
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-3-20110106
980 _ _ |a I:(DE-82)080009_20140620


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21