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000817867 041__ $$aEnglish
000817867 1001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b0$$eCorresponding author
000817867 1112_ $$aIEEE Silicon Nanoelectronics Workshop$$cHonolulu$$d2016-06-12 - 2016-06-14$$wUSA
000817867 245__ $$aResistive switching – from fundamentals of nanoionics redox processes to neuromorphic applications
000817867 260__ $$c2016
000817867 3367_ $$033$$2EndNote$$aConference Paper
000817867 3367_ $$2DataCite$$aOther
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000817867 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
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000817867 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich$$b0$$kFZJ
000817867 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000817867 9141_ $$y2016
000817867 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000817867 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
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