TY  - CONF
AU  - Waser, R.
TI  - Resistive switching – from fundamentals of nanoionics redox processes to neuromorphic applications
M1  - FZJ-2016-04475
PY  - 2016
T2  - IEEE Silicon Nanoelectronics Workshop
CY  - 12 Jun 2016 - 14 Jun 2016, Honolulu (USA)
Y2  - 12 Jun 2016 - 14 Jun 2016
M2  - Honolulu, USA
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/817867
ER  -