%0 Conference Paper
%A Ebert, Philipp
%T Cross-sectional scanning Tunneling microscopy of GaN and InN epitaxial layers: Defects, surface states and Fermi-Level pinning
%M FZJ-2016-05298
%D 2016
%B 20th International Vacuum Congress (IVC-20)
%C 21 Aug 2016 - 26 Aug 2016, Busan (Süd Korea)
Y2 21 Aug 2016 - 26 Aug 2016
M2 Busan, Süd Korea
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/819691