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000819691 041__ $$aEnglish
000819691 1001_ $$0P:(DE-Juel1)130627$$aEbert, Philipp$$b0$$eCorresponding author
000819691 1112_ $$a20th International Vacuum Congress (IVC-20)$$cBusan$$d2016-08-21 - 2016-08-26$$wSüd Korea
000819691 245__ $$aCross-sectional scanning Tunneling microscopy of GaN and InN epitaxial layers: Defects, surface states and Fermi-Level pinning
000819691 260__ $$c2016
000819691 3367_ $$033$$2EndNote$$aConference Paper
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000819691 536__ $$0G:(DE-HGF)POF3-141$$a141 - Controlling Electron Charge-Based Phenomena (POF3-141)$$cPOF3-141$$fPOF III$$x0
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000819691 9141_ $$y2016
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000819691 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
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