TY  - CONF
AU  - Ebert, Philipp
TI  - Cross-sectional scanning Tunneling microscopy of GaN and InN epitaxial layers: Defects, surface states and Fermi-Level pinning
M1  - FZJ-2016-05298
PY  - 2016
T2  - 20th International Vacuum Congress (IVC-20)
CY  - 21 Aug 2016 - 26 Aug 2016, Busan (Süd Korea)
Y2  - 21 Aug 2016 - 26 Aug 2016
M2  - Busan, Süd Korea
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/819691
ER  -