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@INPROCEEDINGS{Ebert:819691,
author = {Ebert, Philipp},
title = {{C}ross-sectional scanning {T}unneling microscopy of
{G}a{N} and {I}n{N} epitaxial layers: {D}efects, surface
states and {F}ermi-{L}evel pinning},
reportid = {FZJ-2016-05298},
year = {2016},
month = {Aug},
date = {2016-08-21},
organization = {20th International Vacuum Congress
(IVC-20), Busan (Süd Korea), 21 Aug
2016 - 26 Aug 2016},
subtyp = {Invited},
cin = {PGI-5},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)6},
url = {https://juser.fz-juelich.de/record/819691},
}