Hauptseite > Publikationsdatenbank > Cross-sectional scanning Tunneling microscopy of GaN and InN epitaxial layers: Defects, surface states and Fermi-Level pinning > print

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100 1 _ |a Ebert, Philipp
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111 2 _ |a 20th International Vacuum Congress (IVC-20)
|c Busan
|d 2016-08-21 - 2016-08-26
|w Süd Korea
245 _ _ |a Cross-sectional scanning Tunneling microscopy of GaN and InN epitaxial layers: Defects, surface states and Fermi-Level pinning
260 _ _ |c 2016
336 7 _ |a Conference Paper
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