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001     819691
005     20240610115317.0
037 _ _ |a FZJ-2016-05298
041 _ _ |a English
100 1 _ |a Ebert, Philipp
|0 P:(DE-Juel1)130627
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|e Corresponding author
111 2 _ |a 20th International Vacuum Congress (IVC-20)
|c Busan
|d 2016-08-21 - 2016-08-26
|w Süd Korea
245 _ _ |a Cross-sectional scanning Tunneling microscopy of GaN and InN epitaxial layers: Defects, surface states and Fermi-Level pinning
260 _ _ |c 2016
336 7 _ |a Conference Paper
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336 7 _ |a Other
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536 _ _ |a 141 - Controlling Electron Charge-Based Phenomena (POF3-141)
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914 1 _ |y 2016
915 _ _ |a No Authors Fulltext
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981 _ _ |a I:(DE-Juel1)ER-C-1-20170209

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