Home > Publications database > Rastertunnelmikroskopie und- Spektroskopie von III-V Halbleiter Nanodrähten > print

001     819692
005     20240610115858.0
037 _ _ |a FZJ-2016-05299
041 _ _ |a German
100 1 _ |a Ebert, Philipp
|0 P:(DE-Juel1)130627
|b 0
|e Corresponding author
111 2 _ |a EFDS Workshop: von Nano bis Makro: neue bildgebende Untersuchungsverfahren für Qualitätskontrolle und Materialforschung
|c Dresden
|d 2016-11-08 - 2016-11-09
|w Deutschland
245 _ _ |a Rastertunnelmikroskopie und- Spektroskopie von III-V Halbleiter Nanodrähten
260 _ _ |c 2016
336 7 _ |a lecture
|2 DRIVER
336 7 _ |a Generic
|0 31
|2 EndNote
336 7 _ |a MISC
|2 BibTeX
336 7 _ |a Lecture
|b lecture
|m lecture
|0 PUB:(DE-HGF)17
|s 1476259753_26739
|2 PUB:(DE-HGF)
|x Invited
336 7 _ |a LECTURE_SPEECH
|2 ORCID
336 7 _ |a Text
|2 DataCite
536 _ _ |a 141 - Controlling Electron Charge-Based Phenomena (POF3-141)
|0 G:(DE-HGF)POF3-141
|c POF3-141
|f POF III
|x 0
909 C O |o oai:juser.fz-juelich.de:819692
|p VDB
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)130627
913 1 _ |a DE-HGF
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-140
|0 G:(DE-HGF)POF3-141
|2 G:(DE-HGF)POF3-100
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
|b Energie
914 1 _ |y 2016
915 _ _ |a No Authors Fulltext
|0 StatID:(DE-HGF)0550
|2 StatID
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-5-20110106
|k PGI-5
|l Mikrostrukturforschung
|x 0
980 _ _ |a lecture
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-5-20110106
981 _ _ |a I:(DE-Juel1)ER-C-1-20170209

LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21