Hauptseite > Publikationsdatenbank > Aufbau einer Vierspitzen-Rastertunnelmikroskop/ Rasterelektronikroskop-Kombination und Leitfähigkeitsmessungen an Silizid Nanodrähten > print

001     819717
005     20210302075937.0
020 _ _ |a 978-3-89336-848-8
024 7 _ |2 Handle
|a 2128/12517
024 7 _ |2 ISSN
|a 1866-1807
037 _ _ |a FZJ-2016-05318
041 _ _ |a German
100 1 _ |0 P:(DE-Juel1)128798
|a Zubkov, Evgeny
|b 0
|e Corresponding author
|g male
|u fzj
245 _ _ |a Aufbau einer Vierspitzen-Rastertunnelmikroskop/ Rasterelektronikroskop-Kombination und Leitfähigkeitsmessungen an Silizid Nanodrähten
|f 2010-01-01 - 2013-12-31
260 _ _ |a Jülich
|b Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag
|c 2013
300 _ _ |a 150 S.
336 7 _ |2 DataCite
|a Output Types/Dissertation
336 7 _ |2 ORCID
|a DISSERTATION
336 7 _ |2 BibTeX
|a PHDTHESIS
336 7 _ |0 2
|2 EndNote
|a Thesis
336 7 _ |0 PUB:(DE-HGF)11
|2 PUB:(DE-HGF)
|a Dissertation / PhD Thesis
|b phd
|m phd
|s 1476349259_31322
336 7 _ |2 DRIVER
|a doctoralThesis
490 0 _ |a Schriften des Forschungszentrum Jülich. Reihe Schlüsseltechnologien/ Key Technologies
|v 55
502 _ _ |a RWTH Aachen, Diss., 2013
|b Dr.
|c RWTH Aachen
|d 2013
520 _ _ |a In this work the combination of a four-tip scanning tunneling microscope with a scanning electron microscope is presented. By means of this apparatus it is possible to perform the conductivity measurements on the in-situ prepared nanostructures in ultra-high vacuum. With the aid of a scanning electron microscope (SEM), it becomes possible to position the tunneling tips of the four-tip scanning tunneling microscope (STM), so that an arrangement for a four-point probe measurement on nanostructures can be obtained. The STM head was built according to the novel coaxial Beetle concept. This concept allows on the one hand, a very compact arrangement of the components of the STM and on the other hand, the new-built STM head has a good mechanical stability, in order to achieve atomic resolution with all four STM units. The atomic resolution of the STM units was confirmed by scanning a Si(111)-7x7 surface. The thermal drift during the STM operation, as well as the resonant frequencies of the mechanical structure of the STM head, were determined. The scanning electron microscope allows the precise and safe navigation of the tunneling tips on the sample surface. Multi tip spectroscopy with up to four STM units can be performed synchronously. To demonstrate the capabilities of the new-built apparatus the conductivity measurements were carried out on metallic yttrium silicide nanowires. The nanowires were prepared by the in-situ deposition of yttrium on a heated Si(110) sample surface. Current-voltage curves were recorded on the nanowires and on the wetting layer in-between. The curves indicate an existence of the Schottky barrier between the yttrium silicide nanowires and the silicon bulk. By means of the two-tip measurements with a gate, the insulating property of the Schottky barrier has been confirmed. Using this Schottky barrier, it is possible to limit the current to the nanowire and to prevent it from flowing through the silicon bulk. A four-tip resistance measurement with a gate has provided the resistance of the nanowire. From the dimensions of the nanowire the resistivity was calculated. The obtained resistivity was found to be in agreement with literature values. In addition, the contact resistances of the tunneling tips on the silicide nanowires were determined.
536 _ _ |0 G:(DE-HGF)POF3-141
|a 141 - Controlling Electron Charge-Based Phenomena (POF3-141)
|c POF3-141
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650 _ 7 |x Diss.
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