000821125 001__ 821125
000821125 005__ 20210129224807.0
000821125 037__ $$aFZJ-2016-06368
000821125 1001_ $$0P:(DE-HGF)0$$aRothe, Felix$$b0$$eCorresponding author
000821125 245__ $$aNiSi/Si and Metal/Tunneling Oxide/Si Contacts$$f - 2016-01-17
000821125 260__ $$c2016
000821125 300__ $$a46p
000821125 3367_ $$2DataCite$$aOutput Types/Supervised Student Publication
000821125 3367_ $$02$$2EndNote$$aThesis
000821125 3367_ $$2BibTeX$$aMASTERSTHESIS
000821125 3367_ $$2DRIVER$$amasterThesis
000821125 3367_ $$0PUB:(DE-HGF)19$$2PUB:(DE-HGF)$$aMaster Thesis$$bmaster$$mmaster$$s1480416024_20527
000821125 3367_ $$2ORCID$$aSUPERVISED_STUDENT_PUBLICATION
000821125 502__ $$aRWTH Aachen, Masterarbeit, 2016$$bMS$$cRWTH Aachen$$d2016
000821125 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000821125 650_7 $$xMasterarbeit
000821125 909CO $$ooai:juser.fz-juelich.de:821125$$pVDB
000821125 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)166044$$aForschungszentrum Jülich$$b0$$kFZJ
000821125 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000821125 9141_ $$y2016
000821125 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000821125 920__ $$lyes
000821125 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0
000821125 980__ $$amaster
000821125 980__ $$aVDB
000821125 980__ $$aUNRESTRICTED
000821125 980__ $$aI:(DE-Juel1)PGI-9-20110106