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001     821125
005     20210129224807.0
037 _ _ |a FZJ-2016-06368
100 1 _ |a Rothe, Felix
|0 P:(DE-HGF)0
|b 0
|e Corresponding author
245 _ _ |a NiSi/Si and Metal/Tunneling Oxide/Si Contacts
|f - 2016-01-17
260 _ _ |c 2016
300 _ _ |a 46p
336 7 _ |a Output Types/Supervised Student Publication
|2 DataCite
336 7 _ |a Thesis
|0 2
|2 EndNote
336 7 _ |a MASTERSTHESIS
|2 BibTeX
336 7 _ |a masterThesis
|2 DRIVER
336 7 _ |a Master Thesis
|b master
|m master
|0 PUB:(DE-HGF)19
|s 1480416024_20527
|2 PUB:(DE-HGF)
336 7 _ |a SUPERVISED_STUDENT_PUBLICATION
|2 ORCID
502 _ _ |a RWTH Aachen, Masterarbeit, 2016
|c RWTH Aachen
|b MS
|d 2016
536 _ _ |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521)
|0 G:(DE-HGF)POF3-521
|c POF3-521
|f POF III
|x 0
650 _ 7 |x Masterarbeit
909 C O |o oai:juser.fz-juelich.de:821125
|p VDB
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)166044
913 1 _ |a DE-HGF
|b Key Technologies
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-520
|0 G:(DE-HGF)POF3-521
|2 G:(DE-HGF)POF3-500
|v Controlling Electron Charge-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
914 1 _ |y 2016
915 _ _ |a No Authors Fulltext
|0 StatID:(DE-HGF)0550
|2 StatID
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-9-20110106
|k PGI-9
|l Halbleiter-Nanoelektronik
|x 0
980 _ _ |a master
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-9-20110106

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