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Highly reliable long-term operation of AlGaN/GaN/AlN HFETs grown on silver substrate
Fox, A.FZJ* ; Mikulics, M. (Corresponding author)FZJ* ; Marso, M. ; Kocan, M. ; Sofer, Z. ; Kordos, P. ; Lüth, H.FZJ* ; Schubert, J.FZJ* ; Grützmacher, D.FZJ* ; Hardtdegen, H.FZJ*
2016
2016The 11th International Conference on Advanced Semiconductor Devices And Microsystems, ASDAM '16, SmoleniceSmolenice, Slovakia, 13 Nov 2016 - 16 Nov 20162016-11-132016-11-16
Contributing Institute(s):
- Halbleiter-Nanoelektronik (PGI-9)
Research Program(s):
- 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
Appears in the scientific report
2016
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