TY  - JOUR
AU  - Zhang, Ruyi
AU  - Liu, Ming
AU  - Lu, Lu
AU  - Mi, Shao-Bo
AU  - Jia, Chun-Lin
AU  - Wang, Hong
TI  - High-performance CuFe$_{2}$ O$_{4}$ epitaxial thin films with enhanced ferromagnetic resonance properties
JO  - RSC Advances
VL  - 6
IS  - 102
SN  - 2046-2069
CY  - London
PB  - RSC Publishing
M1  - FZJ-2016-07463
SP  - 100108 - 100114
PY  - 2016
AB  - Highly epitaxial thin films of copper ferrite (CuFe2O4) have been fabricated on MgAl2O4 (001) substrates at a growth temperature of 400 °C for the first time, we believe, through a radio-frequency sputtering method. Structural analyses through high-resolution X-ray diffraction (HRXRD), Raman spectroscopy, and high-resolution transmission electron microscopy (HRTEM) all confirm the tetragonal spinel phase of CuFe2O4 epitaxial film and high tetragonal distortion (c/a = 1.08) of its unit cells. The 50 nm-thick T-CuFe2O4 epitaxial film shows unique soft magnetism with small coercivity of 23 Oe and decreased magnetization. However, a superior ferromagnetic linewidth of only ∼93 Oe in the post-annealed T-CuFe2O4 film compared with a linewidth of ∼1500 Oe in T-CuFe2O4 single crystal bulk material is also observed, which indicates that epitaxial growth of oxide thin films combined with proper heat-treatment-induced cation engineering can impose novel functionalities.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000386439800062
DO  - DOI:10.1039/C6RA22016A
UR  - https://juser.fz-juelich.de/record/824967
ER  -