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| 001 | 824967 | ||
| 005 | 20240610120523.0 | ||
| 024 | 7 | _ | |a 10.1039/C6RA22016A |2 doi |
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| 037 | _ | _ | |a FZJ-2016-07463 |
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| 100 | 1 | _ | |a Zhang, Ruyi |0 P:(DE-HGF)0 |b 0 |
| 245 | _ | _ | |a High-performance CuFe$_{2}$ O$_{4}$ epitaxial thin films with enhanced ferromagnetic resonance properties |
| 260 | _ | _ | |a London |c 2016 |b RSC Publishing |
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| 520 | _ | _ | |a Highly epitaxial thin films of copper ferrite (CuFe2O4) have been fabricated on MgAl2O4 (001) substrates at a growth temperature of 400 °C for the first time, we believe, through a radio-frequency sputtering method. Structural analyses through high-resolution X-ray diffraction (HRXRD), Raman spectroscopy, and high-resolution transmission electron microscopy (HRTEM) all confirm the tetragonal spinel phase of CuFe2O4 epitaxial film and high tetragonal distortion (c/a = 1.08) of its unit cells. The 50 nm-thick T-CuFe2O4 epitaxial film shows unique soft magnetism with small coercivity of 23 Oe and decreased magnetization. However, a superior ferromagnetic linewidth of only ∼93 Oe in the post-annealed T-CuFe2O4 film compared with a linewidth of ∼1500 Oe in T-CuFe2O4 single crystal bulk material is also observed, which indicates that epitaxial growth of oxide thin films combined with proper heat-treatment-induced cation engineering can impose novel functionalities. |
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| 700 | 1 | _ | |a Liu, Ming |0 P:(DE-HGF)0 |b 1 |e Corresponding author |
| 700 | 1 | _ | |a Lu, Lu |0 P:(DE-Juel1)161232 |b 2 |
| 700 | 1 | _ | |a Mi, Shao-Bo |0 P:(DE-HGF)0 |b 3 |
| 700 | 1 | _ | |a Jia, Chun-Lin |0 P:(DE-Juel1)130736 |b 4 |
| 700 | 1 | _ | |a Wang, Hong |0 P:(DE-HGF)0 |b 5 |e Corresponding author |
| 773 | _ | _ | |a 10.1039/C6RA22016A |g Vol. 6, no. 102, p. 100108 - 100114 |0 PERI:(DE-600)2623224-8 |n 102 |p 100108 - 100114 |t RSC Advances |v 6 |y 2016 |x 2046-2069 |
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