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@ARTICLE{Kovcs:825043,
author = {Kovács, András and Schierholz, Roland and Tillmann,
Karsten},
title = {{FEI} {T}itan {G}2 80-200 {CREWLEY}},
journal = {Journal of large-scale research facilities},
volume = {2},
issn = {2364-091X},
address = {Jülich},
publisher = {Forschungszentrum Jülich},
reportid = {FZJ-2016-07523},
pages = {A43},
year = {2016},
note = {POF-III: Electrochemical Storage},
abstract = {The FEI Titan G2 80-200 CREWLEY is a fourth generation
transmission electron microscope which has been specifically
designed for the investigation of a wide range of solid
state phenomena taking place on the atomic scale of both the
structure and chemical composition. For these purposes, the
FEI Titan G2 80-200 CREWLEY is equipped with a Schottky type
high-brightness electron gun (FEI X-FEG), a Cs probe
corrector (CEOS DCOR), an in-column Super-X energy
dispersive X-ray spectros-copy (EDX) unit (ChemiSTEM
technology), a post-column energy filter system (Gatan
Enfinium ER 977) with dual electron energy-loss spectroscopy
(EELS) option allowing a simultaneous read-out of EDX and
EELS signals at a speed of 1000 spectra per second. For data
recording the microscope is equipped with an angular
dark-field (ADF) scanning TEM (STEM) detector (Fischione
Model 3000), on-axis triple BF, DF1, DF2 detectors, on-axis
BF/DF Gatan detectors as well as a 4 megapixel CCD system
(Gatan UltraScan 1000 XP-P). Typical examples of use and
technical specifications for the instrument are given
below.},
cin = {PGI-5 / IEK-9},
ddc = {620},
cid = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)IEK-9-20110218},
pnm = {131 - Electrochemical Storage (POF3-131)},
pid = {G:(DE-HGF)POF3-131},
typ = {PUB:(DE-HGF)16},
doi = {10.17815/jlsrf-2-68},
url = {https://juser.fz-juelich.de/record/825043},
}