Home > Publications database > FEI Titan G2 80-200 CREWLEY > print |
001 | 825043 | ||
005 | 20240712112838.0 | ||
024 | 7 | _ | |a 10.17815/jlsrf-2-68 |2 doi |
024 | 7 | _ | |a 2128/13207 |2 Handle |
037 | _ | _ | |a FZJ-2016-07523 |
041 | _ | _ | |a English |
082 | _ | _ | |a 620 |
100 | 1 | _ | |a Kovács, András |0 P:(DE-Juel1)144926 |b 0 |e Corresponding author |u fzj |
245 | _ | _ | |a FEI Titan G2 80-200 CREWLEY |
260 | _ | _ | |a Jülich |c 2016 |b Forschungszentrum Jülich |
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500 | _ | _ | |a POF-III: Electrochemical Storage |
520 | _ | _ | |a The FEI Titan G2 80-200 CREWLEY is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale of both the structure and chemical composition. For these purposes, the FEI Titan G2 80-200 CREWLEY is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a Cs probe corrector (CEOS DCOR), an in-column Super-X energy dispersive X-ray spectros-copy (EDX) unit (ChemiSTEM technology), a post-column energy filter system (Gatan Enfinium ER 977) with dual electron energy-loss spectroscopy (EELS) option allowing a simultaneous read-out of EDX and EELS signals at a speed of 1000 spectra per second. For data recording the microscope is equipped with an angular dark-field (ADF) scanning TEM (STEM) detector (Fischione Model 3000), on-axis triple BF, DF1, DF2 detectors, on-axis BF/DF Gatan detectors as well as a 4 megapixel CCD system (Gatan UltraScan 1000 XP-P). Typical examples of use and technical specifications for the instrument are given below. |
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588 | _ | _ | |a Dataset connected to CrossRef |
700 | 1 | _ | |a Schierholz, Roland |0 P:(DE-Juel1)161348 |b 1 |u fzj |
700 | 1 | _ | |a Tillmann, Karsten |0 P:(DE-Juel1)131004 |b 2 |u fzj |
773 | _ | _ | |a 10.17815/jlsrf-2-68 |g Vol. 2, p. A43 |0 PERI:(DE-600)2810938-7 |p A43 |t Journal of large-scale research facilities |v 2 |y 2016 |x 2364-091X |
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