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@INPROCEEDINGS{Wirths:825766,
author = {Wirths, S. and Geiger, R. and Schulte-Braucks, C. and von
den Driesch, N. and Stange, D. and Zabel, T. and Ikonic, Z.
and Hartmann, J.-M. and Mantl, S. and Sigg, H. and
Grutzmacher, D. and Buca, D.},
title = {{D}irect bandgap {G}e{S}n microdisk lasers at 2.5 μm for
monolithic integration on {S}i-platform},
publisher = {IEEE},
reportid = {FZJ-2017-00071},
pages = {2.6.1-2.6.4},
year = {2015},
comment = {[Proceedings] - IEEE, 2015. - ISBN 978-1-4673-9894-7},
booktitle = {[Proceedings] - IEEE, 2015. - ISBN
978-1-4673-9894-7},
abstract = {We report on the first experimental demonstration of direct
bandgap group IV GeSn microdisk (MD) lasers (λem=2.5 µm)
grown on Si(001). The evidence of lasing is supported by a
detailed analysis of strain-dependent emission
characteristics of GeSn alloys with xSn ≥ 12 $at.\%.$
Residual compressive strain within the layer is relieved via
under-etching of the MD enabling increased energy offsets up
to EL-EΓ=80 meV. The lasing threshold and max. temperature
amount to 220 kW/cm2 and 135 K, respectively.},
month = {Jul},
date = {1272015},
organization = {2015 IEEE International Electron
Devices Meeting (IEDM), Washington DC
(USA), 7 Dec 2015 - 9 Dec 2015},
cin = {PGI-9},
cid = {I:(DE-Juel1)PGI-9-20110106},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
doi = {10.1109/IEDM.2015.7409615},
url = {https://juser.fz-juelich.de/record/825766},
}