%0 Conference Paper
%A Pandey, R.
%A Schulte-Braucks, Christian
%A Sajjad, R. N.
%A Barth, M.
%A Gosh, R. K.
%A Grisafe, B.
%A Sharma, P.
%A von den Driesch, Nils
%A Vohra, A.
%A Rayner, B.
%A Loo, R.
%A Mantl, Siegfried
%A Buca, Dan Mihai
%A Yeh, C-C.
%A Wu, C-H.
%A Tsai, W.
%A Antoniadis, D.
%A Datta, S.
%T Performance Benchmarking of p-type In0.65Ga0.35As/GaAs0.4Sb0.6 andGe/Ge0.93Sn0.07 Hetero-junction Tunnel FETs
%M FZJ-2017-00086
%P 19.6.1-19.6.4
%D 2016
%B 2016 IEEE International Electron Devices Meeting (IEDM)
%C 5 Dec 2016 - 7 Dec 2016, San Francisco (USA)
Y2 5 Dec 2016 - 7 Dec 2016
M2 San Francisco, USA
%F PUB:(DE-HGF)8
%9 Contribution to a conference proceedings
%U https://juser.fz-juelich.de/record/825781