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Scaled tri-layer gate oxide for GeSn nanoelectronics
Schulte-Braucks, C. (Corresponding author)FZJ* ; Pandey, R. ; Barth, M. ; von den Driesch, N.FZJ* ; Sharma, P. ; Rayner, B. ; Mantl, S.FZJ* ; Buca, D. M.FZJ* ; Datta, S.
2016
20162016 Semiconductor Interface Specialists Conference (SISC), San DiegoSan Diego, USA, 7 Dec 2016 - 10 Dec 20162016-12-072016-12-10
Contributing Institute(s):
- Halbleiter-Nanoelektronik (PGI-9)
Research Program(s):
- 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
- E2SWITCH - Energy Efficient Tunnel FET Switches and Circuits (619509) (619509)
Appears in the scientific report
2016
Database coverage:No Authors Fulltext