Hauptseite > Publikationsdatenbank > Compositional dependence of the band-gap of Ge$_{1−x−y}$Si$_{x}$Sn$_{y}$ alloys > print |
001 | 825880 | ||
005 | 20210129225450.0 | ||
024 | 7 | _ | |a 10.1063/1.4953784 |2 doi |
024 | 7 | _ | |a 0003-6951 |2 ISSN |
024 | 7 | _ | |a 1077-3118 |2 ISSN |
024 | 7 | _ | |a WOS:000379037200029 |2 WOS |
024 | 7 | _ | |a 2128/17235 |2 Handle |
037 | _ | _ | |a FZJ-2017-00162 |
082 | _ | _ | |a 530 |
100 | 1 | _ | |a Wendav, Torsten |0 P:(DE-HGF)0 |b 0 |e Corresponding author |
245 | _ | _ | |a Compositional dependence of the band-gap of Ge$_{1−x−y}$Si$_{x}$Sn$_{y}$ alloys |
260 | _ | _ | |a Melville, NY |c 2016 |b American Inst. of Physics |
336 | 7 | _ | |a article |2 DRIVER |
336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1483959181_19249 |2 PUB:(DE-HGF) |
336 | 7 | _ | |a ARTICLE |2 BibTeX |
336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
520 | _ | _ | |a The group-IV semiconductor alloy Ge1−x−ySixSny has recently attracted great interest due to its prospective potential for use in optoelectronics, electronics, and photovoltaics. Here, we investigate molecular beam epitaxy grown Ge1−x−ySixSny alloys lattice-matched to Ge with large Si and Sn concentrations of up to 42% and 10%, respectively. The samples were characterized in detail by Rutherford backscattering/channeling spectroscopy for composition and crystal quality, x-ray diffraction for strain determination, and photoluminescence spectroscopy for the assessment of band-gap energies. Moreover, the experimentally extracted material parameters were used to determine the SiSn bowing and to make predictions about the optical transition energy. |
536 | _ | _ | |a 521 - Controlling Electron Charge-Based Phenomena (POF3-521) |0 G:(DE-HGF)POF3-521 |c POF3-521 |f POF III |x 0 |
588 | _ | _ | |a Dataset connected to CrossRef |
700 | 1 | _ | |a Fischer, Inga A. |0 P:(DE-HGF)0 |b 1 |
700 | 1 | _ | |a Montanari, Michele |0 P:(DE-HGF)0 |b 2 |
700 | 1 | _ | |a Zoellner, Marvin Hartwig |0 P:(DE-HGF)0 |b 3 |
700 | 1 | _ | |a Klesse, Wolfgang |0 P:(DE-HGF)0 |b 4 |
700 | 1 | _ | |a Capellini, Giovanni |0 P:(DE-HGF)0 |b 5 |
700 | 1 | _ | |a von den Driesch, Nils |0 P:(DE-Juel1)161247 |b 6 |
700 | 1 | _ | |a Oehme, Michael |0 P:(DE-HGF)0 |b 7 |
700 | 1 | _ | |a Buca, Dan |0 P:(DE-Juel1)125569 |b 8 |
700 | 1 | _ | |a Busch, Kurt |0 P:(DE-HGF)0 |b 9 |
700 | 1 | _ | |a Schulze, Jörg |0 P:(DE-HGF)0 |b 10 |e Corresponding author |
773 | _ | _ | |a 10.1063/1.4953784 |g Vol. 108, no. 24, p. 242104 - |0 PERI:(DE-600)1469436-0 |n 24 |p 242104 - |t Applied physics letters |v 108 |y 2016 |x 1077-3118 |
856 | 4 | _ | |y OpenAccess |u https://juser.fz-juelich.de/record/825880/files/2016%20APL%20-SiGeSn%20bowing%20parameter.pdf |
856 | 4 | _ | |y OpenAccess |x icon |u https://juser.fz-juelich.de/record/825880/files/2016%20APL%20-SiGeSn%20bowing%20parameter.gif?subformat=icon |
856 | 4 | _ | |y OpenAccess |x icon-1440 |u https://juser.fz-juelich.de/record/825880/files/2016%20APL%20-SiGeSn%20bowing%20parameter.jpg?subformat=icon-1440 |
856 | 4 | _ | |y OpenAccess |x icon-180 |u https://juser.fz-juelich.de/record/825880/files/2016%20APL%20-SiGeSn%20bowing%20parameter.jpg?subformat=icon-180 |
856 | 4 | _ | |y OpenAccess |x icon-640 |u https://juser.fz-juelich.de/record/825880/files/2016%20APL%20-SiGeSn%20bowing%20parameter.jpg?subformat=icon-640 |
856 | 4 | _ | |y OpenAccess |x pdfa |u https://juser.fz-juelich.de/record/825880/files/2016%20APL%20-SiGeSn%20bowing%20parameter.pdf?subformat=pdfa |
909 | C | O | |o oai:juser.fz-juelich.de:825880 |p openaire |p open_access |p VDB |p driver |p dnbdelivery |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 6 |6 P:(DE-Juel1)161247 |
910 | 1 | _ | |a Forschungszentrum Jülich |0 I:(DE-588b)5008462-8 |k FZJ |b 8 |6 P:(DE-Juel1)125569 |
913 | 1 | _ | |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-520 |0 G:(DE-HGF)POF3-521 |2 G:(DE-HGF)POF3-500 |v Controlling Electron Charge-Based Phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF3 |
914 | 1 | _ | |y 2016 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0200 |2 StatID |b SCOPUS |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0600 |2 StatID |b Ebsco Academic Search |
915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |b APPL PHYS LETT : 2015 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0110 |2 StatID |b Science Citation Index |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0111 |2 StatID |b Science Citation Index Expanded |
915 | _ | _ | |a IF < 5 |0 StatID:(DE-HGF)9900 |2 StatID |
915 | _ | _ | |a OpenAccess |0 StatID:(DE-HGF)0510 |2 StatID |
915 | _ | _ | |a Peer Review |0 StatID:(DE-HGF)0030 |2 StatID |b ASC |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1150 |2 StatID |b Current Contents - Physical, Chemical and Earth Sciences |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0300 |2 StatID |b Medline |
915 | _ | _ | |a Nationallizenz |0 StatID:(DE-HGF)0420 |2 StatID |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Thomson Reuters Master Journal List |
920 | _ | _ | |l yes |
920 | 1 | _ | |0 I:(DE-Juel1)PGI-9-20110106 |k PGI-9 |l Halbleiter-Nanoelektronik |x 0 |
920 | 1 | _ | |0 I:(DE-82)080009_20140620 |k JARA-FIT |l JARA-FIT |x 1 |
980 | _ | _ | |a journal |
980 | _ | _ | |a VDB |
980 | _ | _ | |a UNRESTRICTED |
980 | _ | _ | |a I:(DE-Juel1)PGI-9-20110106 |
980 | _ | _ | |a I:(DE-82)080009_20140620 |
980 | 1 | _ | |a FullTexts |
Library | Collection | CLSMajor | CLSMinor | Language | Author |
---|