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@ARTICLE{Hooda:825882,
      author       = {Hooda, Sonu and Khan, S. A. and Satpati, B. and Stange, D.
                      and Buca, D. and Bala, M. and Pannu, C. and Kanjilal, D. and
                      Kabiraj, Debdulal},
      title        = {{E}ffect of ion beam parameters on engineering of nanoscale
                      voids and their stability under post-growth annealing},
      journal      = {Applied physics / A},
      volume       = {122},
      number       = {3},
      issn         = {1432-0630},
      address      = {Berlin},
      publisher    = {Springer},
      reportid     = {FZJ-2017-00164},
      pages        = {227},
      year         = {2016},
      abstract     = {Swift heavy ion (SHI) irradiation of damaged germanium
                      (d-Ge) layer results in porous structure with voids aligned
                      along ion trajectory due to local melting and
                      resolidification during high electronic energy deposition.
                      The present study focuses on the irradiation temperature-
                      and incident angle-dependent growth dynamics and shape
                      evolution of these voids due to 100 MeV Ag ions irradiation.
                      The d-Ge layers were prepared by multiple low-energy Ar ion
                      implantations in single crystalline Ge with damage formation
                      of ~7 displacements per atom. Further, these d-Ge layers
                      were irradiated using 100 MeV Ag ions at two different
                      temperatures (77 and 300 K) and three different angles (7°,
                      30° and 45°). After SHI irradiation, substantial volume
                      expansion of d-Ge layer is detected which is due to
                      formation of nanoscale voids. The volume expansion is
                      observed to be more in the samples irradiated at 77 K as
                      compared to 300 K at a given irradiation fluence. It is
                      observed that the voids are of spherical shape at low ion
                      irradiation fluence. The voids grow in size and change their
                      shape from spherical to prolate spheroid with increasing ion
                      fluence. The major axis of spheroid is observed to be
                      aligned approximately along the ion beam direction which has
                      been confirmed by irradiation at three different angles. The
                      change in shape is a consequence of combination of
                      compressive strain and plastic flow developed due to thermal
                      spike generated along ion track. Post-SHI irradiation
                      annealing shows increase in size of voids and reversal of
                      shape from prolate spheroid towards spherical through strain
                      relaxation. The stability of voids was studied with the
                      effect of post-growth annealing.},
      cin          = {PGI-9 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-9-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000371041700086},
      doi          = {10.1007/s00339-016-9776-5},
      url          = {https://juser.fz-juelich.de/record/825882},
}