000826944 001__ 826944
000826944 005__ 20210129225726.0
000826944 037__ $$aFZJ-2017-01151
000826944 1001_ $$0P:(DE-Juel1)130620$$aDittmann, Regina$$b0$$eCorresponding author
000826944 1112_ $$aWorkshop “New Horizons on Redox Processes on Oxide Surfaces – Advanced Spectroscopies and Beyond$$cFish$$d2016-07-12 - 2016-07-15$$wUSA
000826944 245__ $$aDetection and quantification of valence changes in resistive switching devices by the use of spectromicroscopic techniques
000826944 260__ $$c2016
000826944 3367_ $$033$$2EndNote$$aConference Paper
000826944 3367_ $$2DataCite$$aOther
000826944 3367_ $$2BibTeX$$aINPROCEEDINGS
000826944 3367_ $$2DRIVER$$aconferenceObject
000826944 3367_ $$2ORCID$$aLECTURE_SPEECH
000826944 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1485510868_4639$$xInvited
000826944 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000826944 909CO $$ooai:juser.fz-juelich.de:826944$$pVDB
000826944 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130620$$aForschungszentrum Jülich$$b0$$kFZJ
000826944 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000826944 9141_ $$y2016
000826944 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000826944 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000826944 980__ $$aconf
000826944 980__ $$aVDB
000826944 980__ $$aUNRESTRICTED
000826944 980__ $$aI:(DE-Juel1)PGI-7-20110106