000826963 001__ 826963
000826963 005__ 20240610120522.0
000826963 0247_ $$2doi$$a10.1109/TASC.2016.2520465
000826963 0247_ $$2ISSN$$a1051-8223
000826963 0247_ $$2ISSN$$a1558-2515
000826963 0247_ $$2WOS$$aWOS:000372631600001
000826963 037__ $$aFZJ-2017-01170
000826963 041__ $$aEnglish
000826963 082__ $$a530
000826963 1001_ $$0P:(DE-Juel1)144210$$aGundareva, Irina$$b0$$ufzj
000826963 245__ $$aYBa$_{2}$Cu$_{3}$O$_{7-x}$ bicrystal Josephson junctions with high I$_{c}$R$_{n}$-products and wide-ranging resistances for THz applications
000826963 260__ $$aNew York, NY$$bIEEE$$c2016
000826963 3367_ $$2DRIVER$$aarticle
000826963 3367_ $$2DataCite$$aOutput Types/Journal article
000826963 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1485777248_30346
000826963 3367_ $$2BibTeX$$aARTICLE
000826963 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000826963 3367_ $$00$$2EndNote$$aJournal Article
000826963 520__ $$aJosephson junctions with high characteristic voltages IcRn and resistances Rn ranging from subohm values to several hundred ohms are required for various terahertz (THz) applications. Due to optimization of technology, [100]-tilt YBa2Cu3O7-x bicrystal Josephson junctions with an average IcRn (5 K) value of 7 mV at an Rn-range from 0.4 to 400 Ω have been fabricated on (320) bicrystal NdGaO3 substrates. Classical and frequencyselective detection of THz radiation have been demonstrated with the fabricated Josephson junctions. The main characteristics of Josephson oscillators, spectrum analyzers, admittance spectrometers, and classical detectors have been evaluated within this range of junction parameters, and promising results have been obtained.
000826963 536__ $$0G:(DE-HGF)POF3-144$$a144 - Controlling Collective States (POF3-144)$$cPOF3-144$$fPOF III$$x0
000826963 588__ $$aDataset connected to CrossRef
000826963 7001_ $$0P:(DE-Juel1)130621$$aDivin, Yuri$$b1$$ufzj
000826963 773__ $$0PERI:(DE-600)2025387-4$$a10.1109/TASC.2016.2520465$$gp. 1 - 1$$n3$$p1100204$$tIEEE transactions on applied superconductivity$$v26$$x1558-2515$$y2016
000826963 8564_ $$uhttps://juser.fz-juelich.de/record/826963/files/07389349.pdf$$yRestricted
000826963 8564_ $$uhttps://juser.fz-juelich.de/record/826963/files/07389349.gif?subformat=icon$$xicon$$yRestricted
000826963 8564_ $$uhttps://juser.fz-juelich.de/record/826963/files/07389349.jpg?subformat=icon-1440$$xicon-1440$$yRestricted
000826963 8564_ $$uhttps://juser.fz-juelich.de/record/826963/files/07389349.jpg?subformat=icon-180$$xicon-180$$yRestricted
000826963 8564_ $$uhttps://juser.fz-juelich.de/record/826963/files/07389349.jpg?subformat=icon-640$$xicon-640$$yRestricted
000826963 8564_ $$uhttps://juser.fz-juelich.de/record/826963/files/07389349.pdf?subformat=pdfa$$xpdfa$$yRestricted
000826963 909CO $$ooai:juser.fz-juelich.de:826963$$pVDB
000826963 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144210$$aForschungszentrum Jülich$$b0$$kFZJ
000826963 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130621$$aForschungszentrum Jülich$$b1$$kFZJ
000826963 9131_ $$0G:(DE-HGF)POF3-144$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Collective States$$x0
000826963 9141_ $$y2016
000826963 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000826963 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search
000826963 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bIEEE T APPL SUPERCON : 2015
000826963 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000826963 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000826963 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000826963 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5
000826963 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC
000826963 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000826963 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000826963 915__ $$0StatID:(DE-HGF)0550$$2StatID$$aNo Authors Fulltext
000826963 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000826963 920__ $$lyes
000826963 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000826963 980__ $$ajournal
000826963 980__ $$aVDB
000826963 980__ $$aUNRESTRICTED
000826963 980__ $$aI:(DE-Juel1)PGI-5-20110106
000826963 981__ $$aI:(DE-Juel1)ER-C-1-20170209