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@INPROCEEDINGS{Kovcs:827182,
author = {Kovács, András and Li, Zi-An and Caron, Jan and
Dunin-Borkowski, Rafal},
title = {{M}agnetic imaging of skyrmions in {F}e{G}e using off-axis
electron holography},
address = {Weinheim, Germany},
publisher = {Wiley-VCH Verlag GmbH $\&$ Co. KGaA},
reportid = {FZJ-2017-01380},
pages = {739 - 740},
year = {2016},
comment = {European Microscopy Congress 2016: Proceedings / Kovács,
András ;ISBN: 9783527808465},
booktitle = {European Microscopy Congress 2016:
Proceedings / Kovács, András ;ISBN:
9783527808465},
abstract = {Magnetic skyrmions are topologically protected spin
structures that have recently attracted considerable
interest as a result of their physical properties and
potential applications in energy-efficient spintronic
devices for information technology [1]. Magnetic skyrmions
were first observed in B20 compounds, whose
non-centrosymmetric crystal structure gives rise to strong
spin-orbit coupling. In these materials, the
Dzaloshinskii-Moriya interaction results in the formation of
a particle-like chiral spin structure in a regular hexagonal
lattice. Transmission electron microscopy (TEM) offers a
variety of methods for imaging the magnetic structure of
skyrmions, including the Fresnel mode of Lorentz TEM
combined with phase retrieval based on the transport of
intensity equation, scanning TEM combined with differential
phase contrast imaging and off-axis electron holography
(EH). Here, we discuss recent advances in EH-based methods
and related techniques for imaging skyrmion and helical spin
structures in B20 FeGe single crystals as a function of
temperature and applied magnetic field.Focused ion beam
(FIB) milling was used to prepare TEM specimens of FeGe with
a homogenous thickness of ˜100 nm and a large surface area
of ˜50 µm2. FIB-induced damage was reduced by using low
energy (<1 kV) ion milling. In order to form helical and
skyrmion spin structures [2], the FeGe specimens were cooled
below 280 K using a Gatan 636 liquid nitrogen cooling
holder. Fresnel images and off-axis electron holograms were
recorded using an FEI Titan 60-300 TEM operated at 300 kV in
magnetic field free conditions (<0.5 mT) in
aberration-corrected mode. The microscope was equipped with
a conventional Gatan Ultrascan 2k × 2k charge-coupled
device (CCD) camera and two biprisms, which were located in
the first and second selected area aperture planes.Figure 1
shows experimental magnetic phase images and corresponding
magnetic induction maps of skyrmion and helical spin
structures in FeGe recorded using EH. The mean inner
potential and magnetic contributions to the total phase
shift were separated by taking differences between
measurements recorded at low temperature and at room
temperature (when the FeGe is non-magnetic). The phase
resolution of the EH experiments was optimised by acquiring
multiple series of electron holograms and combining them
after cross-correlation, as well as by recording electron
holograms with a direct electron detection (Gatan K2-IS)
camera, which offers an improved detective quantum
efficiency and modulation transfer function when compared
with standard CCD cameras [3]. Skyrmions were studied as a
function of both temperature and magnetic field, which was
applied parallel to the electron beam direction using the
objective lens of the microscope (in free lens control
mode). The twin construction of the objective lens used
allowed the strength and polarity of the magnetic field to
be changed continuously, in order to study the magnetization
reversal dynamics of the skyrmions in situ in the TEM. The
recorded magnetic phase images were also used to calculate
the projected in-plane magnetization distribution in the
sample using a model-based iterative reconstruction
technique. As the inverse problem of reconstructing the
magnetization distribution is ill-posed, regularisation
parameters were used to constrain the solution. Examples of
the resulting magnetisation maps are shown in Fig. 2 for the
helical and skyrmion structures.},
month = {Aug},
date = {2016-08-28},
organization = {16th European Microscopy Congress (EMC
2016), Lyon (France), 28 Aug 2016 - 2
Sep 2016},
cin = {PGI-5 / ER-C-1},
cid = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
doi = {10.1002/9783527808465.EMC2016.6276},
url = {https://juser.fz-juelich.de/record/827182},
}