000827185 001__ 827185
000827185 005__ 20240610120542.0
000827185 0247_ $$2doi$$a10.1002/9783527808465.EMC2016.5140
000827185 037__ $$aFZJ-2017-01383
000827185 041__ $$aEnglish
000827185 1001_ $$0P:(DE-Juel1)157886$$aTavabi, Amir H.$$b0
000827185 1112_ $$a16th European Microscopy Congress (EMC 2016)$$cLyon$$d2016-08-28 - 2016-09-02$$wFrance
000827185 245__ $$aDouble crystal interference experiments
000827185 260__ $$aWeinheim, Germany$$bWiley-VCH Verlag GmbH & Co. KGaA$$c2016
000827185 29510 $$aEuropean Microscopy Congress 2016: Proceedings
000827185 300__ $$a711 - 712
000827185 3367_ $$2ORCID$$aCONFERENCE_PAPER
000827185 3367_ $$033$$2EndNote$$aConference Paper
000827185 3367_ $$2BibTeX$$aINPROCEEDINGS
000827185 3367_ $$2DRIVER$$aconferenceObject
000827185 3367_ $$2DataCite$$aOutput Types/Conference Paper
000827185 3367_ $$0PUB:(DE-HGF)8$$2PUB:(DE-HGF)$$aContribution to a conference proceedings$$bcontrib$$mcontrib$$s1485874506_18207
000827185 3367_ $$0PUB:(DE-HGF)7$$2PUB:(DE-HGF)$$aContribution to a book$$mcontb
000827185 520__ $$aIn 1978, Rackham and co-workers observed remarkable and unusual diffraction patterns from an object that consisted of two perfectly aligned, simultaneously reflecting crystals that were separated by a gap [1]. They reported that they could obtain such double crystals routinely by ion bombardment. However, their specimen preparation method did not allow the the gap between the crystals to be controlled and the maximum gap that they achieved was on the order of 1-2 μm. A subsequent realization of a double crystal interferometer (DCI) was achieved using voids in spinel [2], again with a crystal spacing of below 1 μm. In 1995, Zhou and co-workers [3] presented new results by combining a Si double-crystal interferometer with convergent beam electron diffraction (CBED), taking advantage of a special structure formed at the broken edge of a Si [111] crystal. The gap was still on the order of 1 μm or below.Here, we use focused ion beam (FIB) milling to build DCIs that have gaps of up to 8 μm and to provide better control over results that were previously obtained by chance. Figure 1 shows a top view scanning electron micrograph of such an interferometer. The gap separation is 800 nm. Both single crystal and double crystal areas have been patterned. Superimposed on the image is a sketch of the ray path of a convergent beam that illuminates the upper crystal, generating a transmitted beam and a diffracted beam. These beams, in turn, impinge on the second crystal, generating further transmitted and diffracted beams that overlap in the diffraction plane, resulting in the formation of interference fringes.Figure 2 shows a comparison of diffraction patterns recorded from a single crystal (left) and two overlapped crystals (right). The spacing of the interference fringes depends on the electron wavelength, the excited Bragg reflection and the camera length. More impressive results are obtained when the orientation of the crystal is close to a zone axis. Figure 3 shows a comparison of a standard CBED pattern (left) with a complicated system of interference fringes arising from overlap of many diffracted beams (right). The interference phenomena in these patterns encode information about the crystal structure. The fringe spacing is inversely propotional to the gap width. Therefore, for an 8 μm gap, ten times more fringes are present in the overlapped discs and the interferogram can be considered as a hologram, as showsn in Fig. 4.As suggested by the first experimenters [1], accurate lattice parameter measurements can be made using a DCI when one crystal is the specimen of interest. If, instead, a specimen in inserted between the crystals or deposited onto the lower crystal, then it will be possible to obtain an off-axis Fresnel hologram with a reduced exposure time that is not affected by Fresnel diffraction from the edges of a biprism wire, as is the case when an electron biprism is used as an interferometric device. Moreover, the reduced exposure time due to amplitude division beam splitting could open the way to dynamic recording and processing of holograms.
000827185 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000827185 588__ $$aDataset connected to CrossRef Book
000827185 7001_ $$0P:(DE-Juel1)145413$$aDuchamp, Martial$$b1$$eCorresponding author
000827185 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b2
000827185 7001_ $$0P:(DE-HGF)0$$aPozzi, Giulio$$b3
000827185 773__ $$a10.1002/9783527808465.EMC2016.5140
000827185 8564_ $$uhttps://juser.fz-juelich.de/record/827185/files/emc20165140.pdf$$yRestricted
000827185 8564_ $$uhttps://juser.fz-juelich.de/record/827185/files/emc20165140.gif?subformat=icon$$xicon$$yRestricted
000827185 8564_ $$uhttps://juser.fz-juelich.de/record/827185/files/emc20165140.jpg?subformat=icon-1440$$xicon-1440$$yRestricted
000827185 8564_ $$uhttps://juser.fz-juelich.de/record/827185/files/emc20165140.jpg?subformat=icon-180$$xicon-180$$yRestricted
000827185 8564_ $$uhttps://juser.fz-juelich.de/record/827185/files/emc20165140.jpg?subformat=icon-640$$xicon-640$$yRestricted
000827185 8564_ $$uhttps://juser.fz-juelich.de/record/827185/files/emc20165140.pdf?subformat=pdfa$$xpdfa$$yRestricted
000827185 909CO $$ooai:juser.fz-juelich.de:827185$$pVDB
000827185 9141_ $$y2016
000827185 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)157886$$aForschungszentrum Jülich$$b0$$kFZJ
000827185 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich$$b2$$kFZJ
000827185 9131_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bEnergie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000827185 920__ $$lyes
000827185 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000827185 9201_ $$0I:(DE-Juel1)ER-C-1-20170209$$kER-C-1$$lPhysik Nanoskaliger Systeme$$x1
000827185 980__ $$acontrib
000827185 980__ $$aVDB
000827185 980__ $$acontb
000827185 980__ $$aI:(DE-Juel1)PGI-5-20110106
000827185 980__ $$aI:(DE-Juel1)ER-C-1-20170209
000827185 980__ $$aUNRESTRICTED
000827185 981__ $$aI:(DE-Juel1)ER-C-1-20170209