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@INPROCEEDINGS{Jeangros:827201,
      author       = {Jeangros, Q. and Aebersold, A. B. and Hansen, T. W. and
                      Wagner, J. B. and Dunin-Borkowski, Rafal and Hébert, C. and
                      Van herle, J. and Hessler-Wyser, A.},
      title        = {{E}lectron {E}nergy-{L}oss {S}pectroscopy and
                      {E}nergy-{F}iltered {TEM} {I}maging for the in situ
                      {A}ssessment of {R}eduction-{O}xidation {R}eactions in
                      {N}i-{B}ased {S}olid {O}xide {F}uel {C}ells},
      journal      = {Microscopy and microanalysis},
      volume       = {22},
      number       = {S3},
      issn         = {1435-8115},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2017-01399},
      pages        = {1328 - 1329},
      year         = {2016},
      month         = {Jul},
      date          = {2016-07-24},
      organization  = {Microscopy and MIcroanalysis, Columbus
                       (OH), 24 Jul 2016 - 28 Jul 2016},
      cin          = {PGI-5 / ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16 / PUB:(DE-HGF)8},
      doi          = {10.1017/S1431927616007480},
      url          = {https://juser.fz-juelich.de/record/827201},
}