%0 Conference Paper
%A Simson, M.
%A Dunin-Borkowski, Rafal
%A Hartmann, R.
%A Huth, M.
%A Ihle, S.
%A Jones, L.
%A Kondo, Y.
%A Migunov, V.
%A Nellist, P. D.
%A Ritz, R.
%A Ryll, H.
%A Sagawa, R.
%A Schmidt, J.
%A Soltau, H.
%A Strüder, L.
%A Yang, H.
%T Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
%J Microscopy and microanalysis
%V 22
%N S3
%@ 1435-8115
%C New York, NY
%I Cambridge University Press
%M FZJ-2017-01400
%P 512 - 513
%D 2016
%B Microscopy and Microanalysis
%C 24 Jul 2016 - 28 Jul 2016, Columbus (OH)
Y2 24 Jul 2016 - 28 Jul 2016
M2 Columbus, OH
%F PUB:(DE-HGF)16 ; PUB:(DE-HGF)8
%9 Journal ArticleContribution to a conference proceedings
%R 10.1017/S143192761600341X
%U https://juser.fz-juelich.de/record/827202