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@INPROCEEDINGS{Simson:827202,
      author       = {Simson, M. and Dunin-Borkowski, Rafal and Hartmann, R. and
                      Huth, M. and Ihle, S. and Jones, L. and Kondo, Y. and
                      Migunov, V. and Nellist, P. D. and Ritz, R. and Ryll, H. and
                      Sagawa, R. and Schmidt, J. and Soltau, H. and Strüder, L.
                      and Yang, H.},
      title        = {{P}ushing the {L}imits of {F}ast {A}cquisition in {TEM}
                      {T}omography and 4{D}-{STEM}},
      journal      = {Microscopy and microanalysis},
      volume       = {22},
      number       = {S3},
      issn         = {1435-8115},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2017-01400},
      pages        = {512 - 513},
      year         = {2016},
      month         = {Jul},
      date          = {2016-07-24},
      organization  = {Microscopy and Microanalysis, Columbus
                       (OH), 24 Jul 2016 - 28 Jul 2016},
      cin          = {PGI-5 / ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16 / PUB:(DE-HGF)8},
      doi          = {10.1017/S143192761600341X},
      url          = {https://juser.fz-juelich.de/record/827202},
}