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100 1 _ |a Simson, M.
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111 2 _ |a Microscopy and Microanalysis
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245 _ _ |a Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
260 _ _ |a New York, NY
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300 _ _ |a 512 - 513
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700 1 _ |a Hartmann, R.
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700 1 _ |a Huth, M.
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700 1 _ |a Ihle, S.
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700 1 _ |a Jones, L.
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700 1 _ |a Kondo, Y.
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700 1 _ |a Migunov, V.
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700 1 _ |a Schmidt, J.
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700 1 _ |a Soltau, H.
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700 1 _ |a Strüder, L.
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700 1 _ |a Yang, H.
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773 _ _ |a 10.1017/S143192761600341X
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