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@INPROCEEDINGS{Huth:827204,
      author       = {Huth, M. and Ihle, S. and Ritz, R. and Simson, M. and
                      Soltau, H. and Migunov, V. and Duchamp, M. and
                      Dunin-Borkowski, Rafal and Ryll, H. and Strüder, L.},
      title        = {{E}lectric and {M}agnetic {F}ield {M}apping {W}ith the
                      pn{CCD} ({S}){TEM} {C}amera},
      journal      = {Microscopy and microanalysis},
      volume       = {22},
      number       = {S3},
      issn         = {1435-8115},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2017-01402},
      pages        = {256 - 257},
      year         = {2016},
      month         = {Jul},
      date          = {2016-07-24},
      organization  = {Microscopy and Microanalysis, Columbus
                       (OH), 24 Jul 2016 - 28 Jul 2016},
      cin          = {PGI-5 / ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-5-20110106 / I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16 / PUB:(DE-HGF)8},
      doi          = {10.1017/S1431927616002130},
      url          = {https://juser.fz-juelich.de/record/827204},
}