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000827780 1001_ $$0P:(DE-HGF)0$$aSchaab, J.$$b0
000827780 245__ $$aContact-Free Mapping of Electronic Transport Phenomena of Polar Domains in SrMnO$_{3}$ Films
000827780 260__ $$aCollege Park, Md. [u.a.]$$bAmerican Physical Society$$c2016
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000827780 520__ $$aHigh-resolution mapping of electronic transport phenomena plays an increasingly important role for the characterization of ferroic domains and their functionality. At present, spatially resolved electronic transport data are commonly gained from local two-point measurements, collected in line-by-line scans with a conducting nanosized probe. Here, we introduce an innovative experimental approach based on low-energy electron microscopy. As a model case, we study polar domains of varying conductance in strained SrMnO3. By a direct comparison with conductive atomic force and electrostatic force microscopy, we reveal that the applied low-energy electron-microscopy experiment can be considered as an inverse I(V) measurement, providing access to the local electronic conductance with nanoscale resolution and short data-acquisition times in the order of 10–102  ms. Low-energy electrons thus hold yet unexplored application opportunities as a minimal-invasive probe for local electronic transport phenomena, opening a promising route towards spatially resolved, high-throughput sampling at the nanoscale.
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000827780 7001_ $$0P:(DE-HGF)0$$aKrug, I. P.$$b1
000827780 7001_ $$0P:(DE-Juel1)140485$$aDoğanay, H.$$b2
000827780 7001_ $$0P:(DE-Juel1)164109$$aHackl, J.$$b3
000827780 7001_ $$0P:(DE-HGF)0$$aGottlob, D. M.$$b4
000827780 7001_ $$0P:(DE-Juel1)164112$$aKhan, M. I.$$b5
000827780 7001_ $$0P:(DE-Juel1)164137$$aNemšák, S.$$b6
000827780 7001_ $$0P:(DE-HGF)0$$aMaurel, L.$$b7
000827780 7001_ $$0P:(DE-HGF)0$$aLangenberg, E.$$b8
000827780 7001_ $$0P:(DE-HGF)0$$aAlgarabel, P. A.$$b9
000827780 7001_ $$0P:(DE-HGF)0$$aPardo, J. A.$$b10
000827780 7001_ $$0P:(DE-Juel1)130948$$aSchneider, C. M.$$b11
000827780 7001_ $$0P:(DE-HGF)0$$aMeier, D.$$b12$$eCorresponding author
000827780 773__ $$0PERI:(DE-600)2760310-6$$a10.1103/PhysRevApplied.5.054009$$gVol. 5, no. 5, p. 054009$$n5$$p054009$$tPhysical review applied$$v5$$x2331-7019$$y2016
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