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@ARTICLE{Schaab:827780,
      author       = {Schaab, J. and Krug, I. P. and Doğanay, H. and Hackl, J.
                      and Gottlob, D. M. and Khan, M. I. and Nemšák, S. and
                      Maurel, L. and Langenberg, E. and Algarabel, P. A. and
                      Pardo, J. A. and Schneider, C. M. and Meier, D.},
      title        = {{C}ontact-{F}ree {M}apping of {E}lectronic {T}ransport
                      {P}henomena of {P}olar {D}omains in {S}r{M}n{O}$_{3}$
                      {F}ilms},
      journal      = {Physical review applied},
      volume       = {5},
      number       = {5},
      issn         = {2331-7019},
      address      = {College Park, Md. [u.a.]},
      publisher    = {American Physical Society},
      reportid     = {FZJ-2017-01884},
      pages        = {054009},
      year         = {2016},
      abstract     = {High-resolution mapping of electronic transport phenomena
                      plays an increasingly important role for the
                      characterization of ferroic domains and their functionality.
                      At present, spatially resolved electronic transport data are
                      commonly gained from local two-point measurements, collected
                      in line-by-line scans with a conducting nanosized probe.
                      Here, we introduce an innovative experimental approach based
                      on low-energy electron microscopy. As a model case, we study
                      polar domains of varying conductance in strained SrMnO3. By
                      a direct comparison with conductive atomic force and
                      electrostatic force microscopy, we reveal that the applied
                      low-energy electron-microscopy experiment can be considered
                      as an inverse I(V) measurement, providing access to the
                      local electronic conductance with nanoscale resolution and
                      short data-acquisition times in the order of
                      10–102  ms. Low-energy electrons thus hold yet
                      unexplored application opportunities as a minimal-invasive
                      probe for local electronic transport phenomena, opening a
                      promising route towards spatially resolved, high-throughput
                      sampling at the nanoscale.},
      cin          = {PGI-6},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-6-20110106},
      pnm          = {522 - Controlling Spin-Based Phenomena (POF3-522)},
      pid          = {G:(DE-HGF)POF3-522},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000376015700001},
      doi          = {10.1103/PhysRevApplied.5.054009},
      url          = {https://juser.fz-juelich.de/record/827780},
}