%0 Journal Article
%A Psiuk, B.
%A Szade, J.
%A Pilch, M.
%A Szot, K.
%T XPS studies of perovskites surface instability caused by Ar+ ion and electron bombardment and metal deposition
%J Vacuum
%V 83
%@ 0042-207X
%C Amsterdam [u.a.]
%I Elsevier Science
%M PreJuSER-8287
%P S69 - S72
%D 2008
%Z Record converted from VDB: 12.11.2012
%X X-ray Photoelectron Spectroscopy (XPS) Was Used to study the influence of low energy Ar+ ion bombardment, electron bombardment and Pt deposition on the SrTiO3 (STO) single crystal electronic structure. Atomic composition changes were found and attributed to chemical reconstruction of the STO surface. A clear correlation between the presence of conducting, low Ti oxidation states in valence band and core level changes was detected. A strong effect caused by electron irradiation was ascribed to the electroreduction process. The influence of lanthanum doping on surface instability of STO was also discussed. The La doped sample (STO: 3,75% La) was found to be modified upon Pt metal deposition to a higher degree than pure STO crystal. (C) 2009 Published by Elsevier Ltd.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000266522700018
%R 10.1016/j.vacuum.2009.01.032
%U https://juser.fz-juelich.de/record/8287