TY  - JOUR
AU  - Psiuk, B.
AU  - Szade, J.
AU  - Pilch, M.
AU  - Szot, K.
TI  - XPS studies of perovskites surface instability caused by Ar+ ion and electron bombardment and metal deposition
JO  - Vacuum
VL  - 83
SN  - 0042-207X
CY  - Amsterdam [u.a.]
PB  - Elsevier Science
M1  - PreJuSER-8287
SP  - S69 - S72
PY  - 2008
N1  - Record converted from VDB: 12.11.2012
AB  - X-ray Photoelectron Spectroscopy (XPS) Was Used to study the influence of low energy Ar+ ion bombardment, electron bombardment and Pt deposition on the SrTiO3 (STO) single crystal electronic structure. Atomic composition changes were found and attributed to chemical reconstruction of the STO surface. A clear correlation between the presence of conducting, low Ti oxidation states in valence band and core level changes was detected. A strong effect caused by electron irradiation was ascribed to the electroreduction process. The influence of lanthanum doping on surface instability of STO was also discussed. The La doped sample (STO: 3,75% La) was found to be modified upon Pt metal deposition to a higher degree than pure STO crystal. (C) 2009 Published by Elsevier Ltd.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000266522700018
DO  - DOI:10.1016/j.vacuum.2009.01.032
UR  - https://juser.fz-juelich.de/record/8287
ER  -