001     829119
005     20240619091226.0
024 7 _ |a 10.1088/1361-6528/aa5de3
|2 doi
024 7 _ |a 0957-4484
|2 ISSN
024 7 _ |a 1361-6528
|2 ISSN
024 7 _ |a WOS:000395938500004
|2 WOS
037 _ _ |a FZJ-2017-02929
041 _ _ |a English
082 _ _ |a 530
100 1 _ |a Sydoruk, Viktor
|0 P:(DE-Juel1)128734
|b 0
|u fzj
245 _ _ |a Electronic edge-state and space-charge phenomena in long GaN nanowires and nanoribbonsPGI
260 _ _ |a Bristol
|c 2017
|b IOP Publ.
336 7 _ |a article
|2 DRIVER
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|b journal
|m journal
|0 PUB:(DE-HGF)16
|s 1504697311_6629
|2 PUB:(DE-HGF)
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a Journal Article
|0 0
|2 EndNote
520 _ _ |a We studied space-charge-distribution phenomena in planar GaN nanowires and nanoribbons (NRs). The results obtained at low voltages demonstrate that the electron concentration changes not only at the edges of the NR, but also in the middle part of the NR. The effect is stronger with decreasing NR width. Moreover, the spatial separation of the positive and negative charges results in electric-field patterns outside the NR. This remarkable feature of electrostatic fields outside the NR may be even stronger in 2D material structures. For larger voltages the space-charge-limited current (SCLC) effect determines the main mechanism of transport in the NR samples. The onset of the SCLC effect clearly correlates with the NR width. The results are confirmed by noise spectroscopy studies of the NR transport. We found that the noise increases with decreasing NR width and the shape of the spectra changes with voltage increase with a tendency toward slope (3/2), reflecting diffusion processes due to the SCLC effect. At higher voltages noise decreases as a result of changes in the scattering mechanisms. We suggest that the features of the electric current and noise found in the NRs are of general character and will have an impact on the development of NR-based devices.
536 _ _ |a 523 - Controlling Configuration-Based Phenomena (POF3-523)
|0 G:(DE-HGF)POF3-523
|c POF3-523
|f POF III
|x 0
588 _ _ |a Dataset connected to CrossRef
700 1 _ |a Zadorozhnyi, Ihor
|0 P:(DE-Juel1)164241
|b 1
|u fzj
700 1 _ |a Hardtdegen, Hilde
|0 P:(DE-Juel1)125593
|b 2
|u fzj
700 1 _ |a Lüth, Hans
|0 P:(DE-Juel1)128608
|b 3
|u fzj
700 1 _ |a Petrychuk, Michael
|0 P:(DE-Juel1)167290
|b 4
700 1 _ |a Naumov, A. V.
|0 P:(DE-HGF)0
|b 5
700 1 _ |a Korotyeyev, V. V.
|0 P:(DE-HGF)0
|b 6
700 1 _ |a Kochelap, V. A.
|0 P:(DE-HGF)0
|b 7
700 1 _ |a Belyaev, A. E.
|0 P:(DE-HGF)0
|b 8
700 1 _ |a Vitusevich, Svetlana
|0 P:(DE-Juel1)128738
|b 9
|e Corresponding author
|u fzj
773 _ _ |a 10.1088/1361-6528/aa5de3
|g Vol. 28, no. 13, p. 135204 -
|0 PERI:(DE-600)1362365-5
|n 13
|p 135204 (11pp)
|t Nanotechnology
|v 28
|y 2017
|x 1361-6528
856 4 _ |u https://juser.fz-juelich.de/record/829119/files/Sydoruk_2017_Nanotechnology_28_135204.pdf
|y Restricted
856 4 _ |u https://juser.fz-juelich.de/record/829119/files/Sydoruk_2017_Nanotechnology_28_135204.pdf?subformat=pdfa
|x pdfa
|y Restricted
909 C O |o oai:juser.fz-juelich.de:829119
|p VDB
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)128734
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 1
|6 P:(DE-Juel1)164241
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 2
|6 P:(DE-Juel1)125593
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 3
|6 P:(DE-Juel1)128608
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 9
|6 P:(DE-Juel1)128738
913 1 _ |a DE-HGF
|b Key Technologies
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-520
|0 G:(DE-HGF)POF3-523
|2 G:(DE-HGF)POF3-500
|v Controlling Configuration-Based Phenomena
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF3
914 1 _ |y 2017
915 _ _ |a Nationallizenz
|0 StatID:(DE-HGF)0420
|2 StatID
915 _ _ |a National-Konsortium
|0 StatID:(DE-HGF)0430
|2 StatID
915 _ _ |a JCR
|0 StatID:(DE-HGF)0100
|2 StatID
|b NANOTECHNOLOGY : 2015
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0200
|2 StatID
|b SCOPUS
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0300
|2 StatID
|b Medline
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0310
|2 StatID
|b NCBI Molecular Biology Database
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0600
|2 StatID
|b Ebsco Academic Search
915 _ _ |a Peer Review
|0 StatID:(DE-HGF)0030
|2 StatID
|b ASC
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0199
|2 StatID
|b Thomson Reuters Master Journal List
915 _ _ |a WoS
|0 StatID:(DE-HGF)0110
|2 StatID
|b Science Citation Index
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0150
|2 StatID
|b Web of Science Core Collection
915 _ _ |a WoS
|0 StatID:(DE-HGF)0111
|2 StatID
|b Science Citation Index Expanded
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)1150
|2 StatID
|b Current Contents - Physical, Chemical and Earth Sciences
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)1160
|2 StatID
|b Current Contents - Engineering, Computing and Technology
915 _ _ |a IF < 5
|0 StatID:(DE-HGF)9900
|2 StatID
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-8-20110106
|k PGI-8
|l Bioelektronik
|x 0
920 1 _ |0 I:(DE-Juel1)ICS-8-20110106
|k ICS-8
|l Bioelektronik
|x 1
920 1 _ |0 I:(DE-82)080009_20140620
|k JARA-FIT
|l JARA-FIT
|x 2
920 1 _ |0 I:(DE-Juel1)PGI-9-20110106
|k PGI-9
|l Halbleiter-Nanoelektronik
|x 3
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a I:(DE-Juel1)PGI-8-20110106
980 _ _ |a I:(DE-Juel1)ICS-8-20110106
980 _ _ |a I:(DE-82)080009_20140620
980 _ _ |a I:(DE-Juel1)PGI-9-20110106
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)IBI-3-20200312


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