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@ARTICLE{Schie:829958,
author = {Schie, Marcel and Müller, Michael P. and Salinga, Martin
and Waser, R. and De Souza, Roger A.},
title = {{I}on migration in crystalline and amorphous
{H}f{O}$_{{X}}$},
journal = {The journal of chemical physics},
volume = {146},
number = {9},
issn = {1089-7690},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {FZJ-2017-03562},
pages = {094508 -},
year = {2017},
abstract = {The migration of ions in HfOx was investigated by means of
large-scale, classical molecular-dynamics simulations over
the temperature range 1000≤T/K≤2000. Amorphous HfOx was
studied in both stoichiometric and oxygen-deficient forms
(i.e., with x = 2 and x = 1.9875); oxygen-deficient cubic
and monoclinic phases were also studied. The mean square
displacement of oxygen ions was found to evolve linearly as
a function of time for the crystalline phases, as expected,
but displayed significant negative deviations from linear
behavior for the amorphous phases, that is, the behavior was
sub-diffusive. That oxygen-ion migration was observed for
the stoichiometric amorphous phase argues strongly against
applying the traditional model of vacancy-mediated migration
in crystals to amorphous HfO2. In addition, cation
migration, whilst not observed for the crystalline phases
(as no cation defects were present), was observed for both
amorphous phases. In order to obtain activation enthalpies
of migration, the residence times of the migrating ions were
analyzed. The analysis reveals four activation enthalpies
for the two amorphous phases: 0.29 eV, 0.46 eV, and 0.66 eV
(values very close to those obtained for the monoclinic
structure) plus a higher enthalpy of at least 0.85 eV. In
comparison, the cubic phase is characterized by a single
value of 0.43 eV. Simple kinetic Monte Carlo simulations
suggest that the sub-diffusive behavior arises from
nanoscale confinement of the migrating ions.},
cin = {PGI-7 / JARA-FIT / JARA-HPC},
ddc = {540},
cid = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$ /
$I:(DE-82)080012_20140620$},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521) / Modelling the Valency Change Memory Effect in
Resistive Switching Random Access Memory (RRAM)
$(jpgi70_20120501)$},
pid = {G:(DE-HGF)POF3-521 / $G:(DE-Juel1)jpgi70_20120501$},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000397312800060},
doi = {10.1063/1.4977453},
url = {https://juser.fz-juelich.de/record/829958},
}