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@INPROCEEDINGS{Dittmann:834476,
      author       = {Dittmann, Regina and Hensling, Felix},
      title        = {{E}ngineering the nanoscale defect structure of memristive
                      oxide thin films},
      reportid     = {FZJ-2017-04423},
      year         = {2017},
      month         = {Sep},
      date          = {2017-09-18},
      organization  = {European Materials Research Meeting,
                       Warsaw (Poland), 18 Sep 2017 - 22 Sep
                       2017},
      subtyp        = {Invited},
      cin          = {PGI-7},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521)},
      pid          = {G:(DE-HGF)POF3-521},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/834476},
}