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000834824 037__ $$aFZJ-2017-04715
000834824 041__ $$aEnglish
000834824 1001_ $$0P:(DE-Juel1)161528$$aDurini, Daniel$$b0$$eCorresponding author$$ufzj
000834824 1112_ $$aEmerging Technologies Communications Microsystems Optoelectronics Sensors 2017$$cWarsaw$$d2017-05-28 - 2017-05-30$$gET CMOS 2017$$wPoland
000834824 245__ $$aSiPM-based Scintillator Detectors for Small Angle Neutron Scattering Experiments
000834824 260__ $$c2017
000834824 3367_ $$033$$2EndNote$$aConference Paper
000834824 3367_ $$2DataCite$$aOther
000834824 3367_ $$2BibTeX$$aINPROCEEDINGS
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000834824 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1506341043_17747$$xInvited
000834824 520__ $$aSmall Angle Neutron Scattering (SANS) technique uses cold or thermal neutrons for investigation of soft and condensed matter. Significant developments in microelectronics enabled scintillation-based pixelated neutron detectors that use Silicon Photomultipliers (SiPM) for detecting the visible light generated within a scintillator. We characterized three different SiPM technologies in terms of their radiation hardness. The results of this first study are presented together with the first preliminary characterization results obtained in a beam of cold neutrons of a demonstrator consisting of a 1 mm thick Ce doped 6Li-glass optically coupled to an 8 × 8 pixel Philips DPC module.
000834824 536__ $$0G:(DE-HGF)POF3-632$$a632 - Detector technology and systems (POF3-632)$$cPOF3-632$$fPOF III$$x0
000834824 536__ $$0G:(DE-HGF)POF3-6G15$$a6G15 - FRM II / MLZ (POF3-6G15)$$cPOF3-6G15$$fPOF III$$x1
000834824 536__ $$0G:(DE-HGF)POF3-6G4$$a6G4 - Jülich Centre for Neutron Research (JCNS) (POF3-623)$$cPOF3-623$$fPOF III$$x2
000834824 536__ $$0G:(DE-Juel1)HITEC-20170406$$aHITEC - Helmholtz Interdisciplinary Doctoral Training in Energy and Climate Research (HITEC) (HITEC-20170406)$$cHITEC-20170406$$x3
000834824 65027 $$0V:(DE-MLZ)SciArea-220$$2V:(DE-HGF)$$aInstrument and Method Development$$x0
000834824 65017 $$0V:(DE-MLZ)GC-2002-2016$$2V:(DE-HGF)$$aInstrument and Method Development$$x0
000834824 693__ $$0EXP:(DE-MLZ)KWS1-20140101$$1EXP:(DE-MLZ)FRMII-20140101$$5EXP:(DE-MLZ)KWS1-20140101$$6EXP:(DE-MLZ)NL3b-20140101$$aForschungs-Neutronenquelle Heinz Maier-Leibnitz $$eKWS-1: Small angle scattering diffractometer$$fNL3b$$x0
000834824 7001_ $$0P:(DE-Juel1)167475$$aDegenhardt, Carsten$$b1$$ufzj
000834824 7001_ $$0P:(DE-Juel1)156322$$aHerzkamp, Matthias$$b2$$ufzj
000834824 7001_ $$0P:(DE-Juel1)169828$$aKumar, Shashank$$b3$$ufzj
000834824 7001_ $$0P:(DE-Juel1)133922$$aNöldgen, Holger$$b4$$ufzj
000834824 7001_ $$0P:(DE-Juel1)144382$$aFeoktystov, Artem$$b5$$ufzj
000834824 7001_ $$0P:(DE-Juel1)133944$$aStreun, Matthias$$b6$$ufzj
000834824 7001_ $$0P:(DE-Juel1)130632$$aErven, Andreas$$b7$$ufzj
000834824 7001_ $$0P:(DE-Juel1)142562$$avan Waasen, Stefan$$b8$$ufzj
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000834824 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)133922$$aForschungszentrum Jülich$$b4$$kFZJ
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000834824 9131_ $$0G:(DE-HGF)POF3-632$$1G:(DE-HGF)POF3-630$$2G:(DE-HGF)POF3-600$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bForschungsbereich Materie$$lMaterie und Technologie$$vDetector technology and systems$$x0
000834824 9131_ $$0G:(DE-HGF)POF3-6G15$$1G:(DE-HGF)POF3-6G0$$2G:(DE-HGF)POF3-600$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$9G:(DE-HGF)POF3-6G15$$aDE-HGF$$bForschungsbereich Materie$$lGroßgeräte: Materie$$vFRM II / MLZ$$x1
000834824 9131_ $$0G:(DE-HGF)POF3-623$$1G:(DE-HGF)POF3-620$$2G:(DE-HGF)POF3-600$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$9G:(DE-HGF)POF3-6G4$$aDE-HGF$$bForschungsbereich Materie$$lVon Materie zu Materialien und Leben$$vFacility topic: Neutrons for Research on Condensed Matter$$x2
000834824 9141_ $$y2017
000834824 920__ $$lyes
000834824 9201_ $$0I:(DE-Juel1)ZEA-2-20090406$$kZEA-2$$lZentralinstitut für Elektronik$$x0
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