000836008 001__ 836008 000836008 005__ 20240711113757.0 000836008 0247_ $$2doi$$a10.1088/1741-4326/aa70bb 000836008 0247_ $$2ISSN$$a0029-5515 000836008 0247_ $$2ISSN$$a1741-4326 000836008 0247_ $$2WOS$$aWOS:000403048600001 000836008 0247_ $$2altmetric$$aaltmetric:20824028 000836008 037__ $$aFZJ-2017-05133 000836008 041__ $$aEnglish 000836008 082__ $$a530 000836008 1001_ $$0P:(DE-HGF)0$$aRusu, M. I.$$b0 000836008 245__ $$aPreparing the future post-mortem analysis of beryllium-based JET and ITER samples by multi-wavelengths Raman spectroscopy on implanted Be, and co-deposited Be 000836008 260__ $$aVienna$$bIAEA$$c2017 000836008 3367_ $$2DRIVER$$aarticle 000836008 3367_ $$2DataCite$$aOutput Types/Journal article 000836008 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1501249361_31968 000836008 3367_ $$2BibTeX$$aARTICLE 000836008 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000836008 3367_ $$00$$2EndNote$$aJournal Article 000836008 520__ $$aThis study demonstrates that Raman microscopy is a suitable technique for future post mortem analyses of JET and ITER plasma facing components. We focus here on laboratory deposited and bombarded samples of beryllium and beryllium carbides and start to build a reference spectral databases for fusion relevant beryllium-based materials. We identified the beryllium phonon density of states, its second harmonic and E 2G and B 2G second harmonic and combination modes for defective beryllium in the spectral range 300–700 and 700–1300 cm−1, lying close to Be–D modes of beryllium hydrides. We also identified beryllium carbide signature, Be2C, combining Raman microscopy and DFT calculation. We have shown that, depending on the optical constants of the material probed, in depth sensitivity at the nanometer scale can be performed using different wavelengths. This way, we demonstrate that multi-wavelength Raman microscopy is sensitive to in-depth stress caused by ion implantation (down to ≈30 nm under the surface for Be) and Be/C concentration (down to 400 nm or more under the surface for Be+C), which is a main contribution of this work. The depth resolution reached can then be adapted for studying the supersaturated surface layer found on tokamak deposits. 000836008 536__ $$0G:(DE-HGF)POF3-113$$a113 - Methods and Concepts for Material Development (POF3-113)$$cPOF3-113$$fPOF III$$x0 000836008 588__ $$aDataset connected to CrossRef 000836008 7001_ $$0P:(DE-HGF)0$$aPardanaud, C.$$b1$$eCorresponding author 000836008 7001_ $$0P:(DE-HGF)0$$aFerro, Y.$$b2 000836008 7001_ $$0P:(DE-HGF)0$$aGiacometti, G.$$b3 000836008 7001_ $$0P:(DE-HGF)0$$aMartin, C.$$b4 000836008 7001_ $$0P:(DE-HGF)0$$aAddab, Y.$$b5 000836008 7001_ $$0P:(DE-HGF)0$$aRoubin, P.$$b6 000836008 7001_ $$0P:(DE-HGF)0$$aMinissale, M.$$b7 000836008 7001_ $$0P:(DE-HGF)0$$aFerri, L.$$b8 000836008 7001_ $$0P:(DE-HGF)0$$aVirot, F.$$b9 000836008 7001_ $$0P:(DE-HGF)0$$aBarrachin, M.$$b10 000836008 7001_ $$0P:(DE-HGF)0$$aLungu, C. 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