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000836733 0247_ $$2Handle$$a2128/15150
000836733 0247_ $$2URN$$aurn:nbn:de:0001-2017081723
000836733 0247_ $$2ISSN$$a1866-1793
000836733 020__ $$a978-3-95806-228-3
000836733 037__ $$aFZJ-2017-05792
000836733 041__ $$aEnglish
000836733 1001_ $$0P:(DE-Juel1)156550$$aMisic, Boris$$b0$$eCorresponding author$$gmale$$ufzj
000836733 245__ $$aAnalysis and Simulation of Macroscopic Defects in Cu(In,Ga)Se$_{2}$ Photovoltaic Thin Film Modules$$f- 2017-08-17
000836733 260__ $$aJülich$$bForschungszentrum Jülich GmbH Zentralbibliothek,  Verlag$$c2017
000836733 300__ $$aiv, 147 S.
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000836733 4900_ $$aSchriften des Forschungszentrums Jülich Reihe Energie & Umwelt / Energy & Environment$$v372
000836733 502__ $$aRWTH Aachen, Diss., 2015$$bDr.$$cRWTH Aachen$$d2015
000836733 520__ $$aThe present work deals with production induced defects in CIGS thin film modules which can deteriorate the electrical performance of the module. The motivation of this work is toboth nd ways how these defects can be diagnosed, e.g. in a quality control in the productionsite, and to gain a better understanding of the actual defect inuence on the voltage and current in the surrounding of the defect. Thus, I investigate the use of electroluminescence and thermography as diagnostic tools to detect and identify common defects occurring in CIGS production. I begin this work with a study of the CIGS production process and list potential defect origins for relevant production steps. In order to allow an experimental investigation of defects, I intentionally implement them into CIGS photovoltaic modules in a real CIGS production site environment. The defect implementation includes e.g. interrupted P1, P2, and P3 scribing lines for the monolithic series connection, as they can be caused by faulty scribing tools, and changes in the normal CIGS layer structure, as they can be caused by local contamination. Furthermore, I vary the geometry of the implemented defects. I characterise the implemented defects with microscope, electroluminescence (EL), and dark lock-in thermography (DLIT) measurements. EL and DLIT are chosen as they are spatially resolved measurements and therefore allow a comparatively fast investigation of a complete module. In addition to the defect measurements, I implement a software that is based on the principle of network simulation model and allows to model and simulate the implemented defect types in a CIGS module. The software models the CIGS module with a network, that consists of equivalent circuits of a solar cell and resistances, and translates the network into a non-linear system of equations that are solved. Finally, I investigate methods to repair an incomplete insulation of the Mo back contacts of two neighbouring cells. [...]
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000836733 9141_ $$y2017
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