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@PHDTHESIS{Misic:836733,
author = {Misic, Boris},
title = {{A}nalysis and {S}imulation of {M}acroscopic {D}efects in
{C}u({I}n,{G}a){S}e$_{2}$ {P}hotovoltaic {T}hin {F}ilm
{M}odules},
volume = {372},
school = {RWTH Aachen},
type = {Dr.},
address = {Jülich},
publisher = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
reportid = {FZJ-2017-05792},
isbn = {978-3-95806-228-3},
series = {Schriften des Forschungszentrums Jülich Reihe Energie $\&$
Umwelt / Energy $\&$ Environment},
pages = {iv, 147 S.},
year = {2017},
note = {RWTH Aachen, Diss., 2015},
abstract = {The present work deals with production induced defects in
CIGS thin film modules which can deteriorate the electrical
performance of the module. The motivation of this work is
toboth nd ways how these defects can be diagnosed, e.g. in a
quality control in the productionsite, and to gain a better
understanding of the actual defect inuence on the voltage
and current in the surrounding of the defect. Thus, I
investigate the use of electroluminescence and thermography
as diagnostic tools to detect and identify common defects
occurring in CIGS production. I begin this work with a study
of the CIGS production process and list potential defect
origins for relevant production steps. In order to allow an
experimental investigation of defects, I intentionally
implement them into CIGS photovoltaic modules in a real CIGS
production site environment. The defect implementation
includes e.g. interrupted P1, P2, and P3 scribing lines for
the monolithic series connection, as they can be caused by
faulty scribing tools, and changes in the normal CIGS layer
structure, as they can be caused by local contamination.
Furthermore, I vary the geometry of the implemented defects.
I characterise the implemented defects with microscope,
electroluminescence (EL), and dark lock-in thermography
(DLIT) measurements. EL and DLIT are chosen as they are
spatially resolved measurements and therefore allow a
comparatively fast investigation of a complete module. In
addition to the defect measurements, I implement a software
that is based on the principle of network simulation model
and allows to model and simulate the implemented defect
types in a CIGS module. The software models the CIGS module
with a network, that consists of equivalent circuits of a
solar cell and resistances, and translates the network into
a non-linear system of equations that are solved. Finally, I
investigate methods to repair an incomplete insulation of
the Mo back contacts of two neighbouring cells. [...]},
cin = {IEK-5},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {899 - ohne Topic (POF3-899)},
pid = {G:(DE-HGF)POF3-899},
typ = {PUB:(DE-HGF)3 / PUB:(DE-HGF)11},
urn = {urn:nbn:de:0001-2017081723},
url = {https://juser.fz-juelich.de/record/836733},
}