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@ARTICLE{VanRenterghem:836979,
author = {Van Renterghem, W. and Uytdenhouwen, I. and Loewenhoff, Th.
and Wirtz, M.},
title = {{TEM} {A}nalysis of {R}ecrystallized {D}ouble{F}forged
{T}ungsten {A}fter {E}xposure in {JUDITH} 1 and {JUDITH} 2},
journal = {Nuclear materials and energy},
volume = {9},
issn = {2352-1791},
address = {Amsterdam [u.a.]},
publisher = {Elsevier},
reportid = {FZJ-2017-06001},
pages = {484 - 489},
year = {2016},
abstract = {Five samples of recrystallized pure tungsten were exposed
to transient heat loads using the electron beam of the
JUDITH 1 and JUDITH 2 installations of Forschungszentrum
Jülich. The heat flux and base temperature were the same
for all samples; only the number of pulses and exposure
device differed. Transmission electron microscopy was
applied to determine the first defects that are introduced
during exposure and to compare the effects of the two
machines. With increasing number of pulses, first
dislocations are formed near the grain boundaries, and then
line dislocations and clusters of dislocations appear within
the grains. Upon prolonged exposure, the dislocations
migrate and cluster in dislocation pile-ups. Comparing
exposure in JUDITH 1 to JUDITH 2, the amount of defects is
much higher in the samples exposed in JUDITH 1.},
cin = {IEK-2},
ddc = {333.7},
cid = {I:(DE-Juel1)IEK-2-20101013},
pnm = {174 - Plasma-Wall-Interaction (POF3-174)},
pid = {G:(DE-HGF)POF3-174},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000391191500084},
doi = {10.1016/j.nme.2016.04.003},
url = {https://juser.fz-juelich.de/record/836979},
}